A SiC IGBT Behavioral Model with High Accuracy and Fast Convergence

AbstractIn this note we propose a fractional generalization of the classical modified Bessel equation. Instead of the integer-order derivatives we use the Riemann-Liouville version. Next, we solve the fractional modified Bessel equation in terms of the power series and provide an asymptotic analysis of its solution for large arguments. We find a leading-order term of the asymptotic formula for the solution to the considered equation. This behavior is verified numerically and shows high accuracy and fast convergence. Our results reduce to the classical formulas when the order of the fractional derivative goes to integer values.

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Managing high-accuracy and fast convergence in OPC

10.1117/12.686725 ◽

2006 ◽

Cited By ~ 1

Author(s):

Klaus Herold ◽

Norman Chen ◽

Ian P. Stobert

Keyword(s):

High Accuracy ◽

Fast Convergence

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A fast convergence speed and high accuracy calibration method for pipelined ADCs based on the conjugate gradient algorithm

2016 13th IEEE International Conference on Solid-State and Integrated Circuit Technology (ICSICT) ◽

10.1109/icsict.2016.7999082 ◽

2016 ◽

Author(s):

Sujuan Liu ◽

Zhenzhen Zhao ◽

Chuyu Xia

Keyword(s):

Conjugate Gradient ◽

Calibration Method ◽

High Accuracy ◽

Convergence Speed ◽

Fast Convergence ◽

Conjugate Gradient Algorithm ◽

Gradient Algorithm ◽

Pipelined Adcs

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A new super-twisting algorithm with state extension of sliding variable toward fast convergence of high accuracy

2015 12th International Computer Conference on Wavelet Active Media Technology and Information Processing (ICCWAMTIP) ◽

10.1109/iccwamtip.2015.7493902 ◽

2015 ◽

Cited By ~ 1

Author(s):

Yi Yang ◽

Shiyin Qin

Keyword(s):

High Accuracy ◽

Fast Convergence ◽

Twisting Algorithm ◽

State Extension

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Consensus Under Bounded Noise in Discrete Network Systems: An Algorithm With Fast Convergence and High Accuracy

IEEE Transactions on Cybernetics ◽

10.1109/tcyb.2015.2491368 ◽

2016 ◽

Vol 46 (12) ◽

pp. 2874-2884 ◽

Cited By ~ 13

Author(s):

Jianping He ◽

Mengjie Zhou ◽

Peng Cheng ◽

Ling Shi ◽

Jiming Chen

Keyword(s):

High Accuracy ◽

Fast Convergence ◽

Bounded Noise ◽

Network Systems

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A new method for cable shape finding of self-anchored suspension bridges

IABSE Congress, New York, New York 2019: The Evolving Metropolis ◽

10.2749/newyork.2019.0519 ◽

2019 ◽

Author(s):

Chao Liu ◽

Zhan Gao

Keyword(s):

High Accuracy ◽

Measured Data ◽

Convergence Speed ◽

Fast Convergence ◽

Hebei Province ◽

New Method ◽

Suspension Bridges ◽

Coordinate Method

<p>This paper proposes a new overall coordinate method (OCM) to determine the cable shape of self-anchored suspension bridges. In this method, the initial cable shape between adjacent clamps is assumed to be linear and the target cable shape is calculated by iterations based on the overall equilibrium of forces. This method is used to calculate the cable shape of the Chishui Bay Bridge in Hebei Province by MATLAB, and the results are compared with the measured data. The comparison shows that the OCM has a fast convergence speed and high accuracy.</p>

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A New 1,000 kV Electron Microscope

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100061318 ◽

1967 ◽

Vol 25 ◽

pp. 260-261

Author(s):

M. Nishigaki ◽

S. Katagiri ◽

H. Kimura ◽

B. Tadano

Keyword(s):

Electron Microscope ◽

High Voltage ◽

Basic Research ◽

Chromatic Aberration ◽

High Accuracy ◽

Biological Specimen ◽

Voltage Electron ◽

High Voltage Electron Microscope ◽

High Voltage Electron

The high voltage electron microscope has many advantageous features in comparison with the ordinary electron microscope. They are a higher penetrating efficiency of the electron, low chromatic aberration, high accuracy of the selected area diffraction and so on. Thus, the high voltage electron microscope becomes an indispensable instrument for the metallurgical, polymer and biological specimen studies. The application of the instrument involves today not only basic research but routine survey in the various fields. Particularly for the latter purpose, the performance, maintenance and reliability of the microscope should be same as those of commercial ones. The authors completed a 500 kV electron microscope in 1964 and a 1,000 kV one in 1966 taking these points into consideration. The construction of our 1,000 kV electron microscope is described below.

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