New Sampling Strategies for Form Evaluation of Free-Form Surfaces
Abstract New strategies to determine the location of the measurement points for form evaluation of free-form surfaces by using Coordinate Measuring Machines are investigated. The newly developed corrected length method locates the measurement points on constant curvature contour lines. The length and the rank of each contour line are used as parameters to control the distribution of the measurement points. The experimental results have shown that the proposed method is more robust than the known methods currently being used for form evaluation of free-form surfaces. The method also offers opportunities for developing more efficient probe-path generation strategies, since the measurement points are located on continuous paths formed by constant curvature contour lines.