Nondestructive depth profile study of oxygen‐exposed large‐grain silver using angle‐resolved Auger electron spectroscopy and ion scattering spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.577624 ◽

1991 ◽

Vol 9 (3) ◽

pp. 1344-1350 ◽

Author(s):

Mark R. Davidson ◽

Gar B. Hoflund ◽

R. A. Outlaw

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Ion Scattering Spectroscopy ◽

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Chemistry of Metal and Alloy Adherends by Secondary Ion Mass Spectroscopy, Ion Scattering Spectroscopy, and Auger Electron Spectroscopy

Surface Analysis Techniques for Metallurgical Applications ◽

10.1520/stp39064s ◽

2009 ◽

pp. 86-86-15

Author(s):

WL Baun ◽

NT McDevitt ◽

JS Solomon

Keyword(s):

Auger Electron Spectroscopy ◽

Mass Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Secondary Ion Mass Spectroscopy ◽

Ion Scattering Spectroscopy ◽

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Determination of the Low Temperature Diffusion of Chromium Through Gold Films by Ion Scattering Spectroscopy and Auger Electron Spectroscopy

Surface Analysis Techniques for Metallurgical Applications ◽

10.1520/stp39062s ◽

2009 ◽

pp. 68-68-11 ◽

Author(s):

GC Nelson ◽

PH Holloway

Keyword(s):

Low Temperature ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Temperature Diffusion ◽

Ion Scattering Spectroscopy

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Surface characterization study of InP(100) substrates using ion-scattering spectroscopy, Auger electron spectroscopy and electron spectroscopy for chemical analysis I: Comparison of substrate-cleaning techniques

Thin Solid Films ◽

10.1016/0040-6090(91)90247-u ◽

1991 ◽

Vol 197 (1-2) ◽

pp. 367-380 ◽

Author(s):

Stuart J. Hoekje ◽

Gar B. Hoflund

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Characterization ◽

Ion Scattering ◽

Characterization Study ◽

Ion Scattering Spectroscopy ◽

Substrate Cleaning

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Auger electron spectroscopy and ion scattering spectroscopy studies of altered layer formation in AlN thin film prepared by post-irradiation with N2+ ions

Surface and Interface Analysis ◽

10.1002/sia.1232 ◽

2002 ◽

Vol 33 (5) ◽

pp. 437-440 ◽

Author(s):

Y. Mizuhara ◽

R. Mitsuhashi ◽

T. Nagatomi ◽

Y. Takai ◽

M. Inoue

Keyword(s):

Thin Film ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Layer Formation ◽

Ion Scattering ◽

Post Irradiation ◽

Altered Layer ◽

Ion Scattering Spectroscopy ◽

Spectroscopy Studies

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Photoelectron Spectroscopy (XPS and UPS), Auger Electron Spectroscopy (AES), and Ion Scattering Spectroscopy (ISS)

Handbook of Surface and Interface Analysis ◽

10.1201/9781420007800-c3 ◽

2009 ◽

pp. 19-64

Author(s):

Vaneica Young ◽

Gar Hoflund

Keyword(s):

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Ion Scattering Spectroscopy

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Summary Abstract: Chemical analysis of in situ fractured materials by x‐ray photoelectron spectroscopy, Auger electron spectroscopy, and ion scattering spectroscopy

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.574634 ◽

1987 ◽

Vol 5 (4) ◽

pp. 1179-1180 ◽

Author(s):

F. Stucki ◽

P. Brüesch ◽

F. Greuter ◽

E. Gisler

Keyword(s):

Chemical Analysis ◽

Auger Electron Spectroscopy ◽

Photoelectron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

X Ray ◽

Ion Scattering Spectroscopy

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A comparative Rutherford backscattering spectrometry and Auger electron spectroscopy depth profile study of Fe-N films

Thin Solid Films ◽

10.1016/0040-6090(88)90269-6 ◽

1988 ◽

Vol 161 ◽

pp. L69-L70 ◽

Author(s):

H. De Rugy ◽

J.P. Langeron ◽

S. Bouquet ◽

L. Minel ◽

G.I. Grigonov ◽

...

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Electron Spectroscopy ◽

Auger Electron ◽

Rutherford Backscattering Spectrometry ◽

Rutherford Backscattering ◽

Auger Electron Spectroscopy Depth ◽

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Study of surface segregation of simultaneously evaporated Mn-Ag alloy films by means of ion scattering spectroscopy and Auger electron spectroscopy

Thin Solid Films ◽

10.1016/0040-6090(88)90106-x ◽

1988 ◽

Vol 164 ◽

pp. 37-41 ◽

Author(s):

Teruo Hanawa ◽

Itsuo Katayama ◽

Fumiya Shoji ◽

Kenjiro Oura

Keyword(s):

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Surface Segregation ◽

Ion Scattering ◽

Alloy Films ◽

Ion Scattering Spectroscopy

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Auger electron spectroscopy depth profile study in fracture surfaces of sinterized YBa2Cu3O7−x

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.576439 ◽

1990 ◽

Vol 8 (6) ◽

pp. 4021-4025 ◽

Author(s):

J. Colino ◽

J. L. Sacedon ◽

L. Del Olmo ◽

J. L. Vincent

Keyword(s):

Auger Electron Spectroscopy ◽

Depth Profile ◽

Electron Spectroscopy ◽

Auger Electron ◽

Fracture Surfaces ◽

Auger Electron Spectroscopy Depth ◽

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Ion scattering spectroscopy and Auger electron spectroscopy depth profiles of silver–copper thin film interdiffusion

Journal of Vacuum Science & Technology A Vacuum Surfaces and Films ◽

10.1116/1.573991 ◽

1986 ◽

Vol 4 (3) ◽

pp. 1671-1674 ◽

Author(s):

J. R. Pitts ◽

A. W. Czanderna ◽

T. M. Thomas

Keyword(s):

Thin Film ◽

Auger Electron Spectroscopy ◽

Electron Spectroscopy ◽

Auger Electron ◽

Ion Scattering ◽

Copper Thin Film ◽

Depth Profiles ◽

Silver Copper ◽

Ion Scattering Spectroscopy ◽

Auger Electron Spectroscopy Depth

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