Ion scattering spectroscopy and Auger electron spectroscopy depth profiles of silver–copper thin film interdiffusion
1986 ◽
Vol 4
(3)
◽
pp. 1671-1674
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1994 ◽
Vol 22
(1-12)
◽
pp. 175-180
◽
2009 ◽
pp. 86-86-15
2009 ◽
pp. 68-68-11
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1991 ◽
Vol 9
(3)
◽
pp. 1344-1350
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1987 ◽
Vol 5
(4)
◽
pp. 1209-1212
◽
1991 ◽
Vol 197
(1-2)
◽
pp. 367-380
◽
1995 ◽
Vol 84
(1)
◽
pp. 23-29
◽
2018 ◽
Vol 36
(3)
◽
pp. 03E104
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