secondary ion mass spectroscopy
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2019 ◽  
Vol 25 (2) ◽  
pp. 2667-2674 ◽  
Author(s):  
Minoru Muranaka ◽  
Kazuya Sasaki ◽  
Akihiro Suzuki ◽  
Takayuki Terai


Author(s):  
M. Simard-Normandin ◽  
C. Banks ◽  
N. Havercroft ◽  
P. Clark ◽  
E. Tallarek

Abstract This presentation demonstrates how Time-of-Flight Secondary Ion Mass Spectroscopy provides unique information to identify suspect counterfeit semiconductor devices. An example is shown where the epitaxial layers of a light emitting device (LED) do not match those of the exemplar. Keywords: Secondary Ion Mass Spectroscopy, SIMS, counterfeit detection, LED, Light emitting diode.



2018 ◽  
Vol 58 (6) ◽  
pp. 405-414 ◽  
Author(s):  
Tshaiya Devi Thandauthapani ◽  
Adam J. Reeve ◽  
Adam S. Long ◽  
Ian J. Turner ◽  
James S. Sharp




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