Evaluation of image-placement distortion contributors of the EL-3+ electron-beam lithography system in x-ray mask fabrication

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Yohannes M Desta ◽  
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pp. 165-172 ◽  
Author(s):  
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S.A. Rishton ◽  
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D.E. Seeger ◽  
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2016 ◽  
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