One-dimensional photonic crystals composed of alternating layers with high- and low-density were fabricated using two-photon polymerization from a single photosensitive polymer for the infrared spectral range. By introducing single high-density layers to break the periodicity of the photonic crystals, a narrow-band defect mode is induced. The defect mode is located in the center of the photonic bandgap of the one-dimensional photonic crystal. The fabricated photonic crystals were investigated using infrared reflection measurements. Stratified-layer optical models were employed in the design and characterization of the spectral response of the photonic crystals. A very good agreement was found between the model-calculated and measured reflection spectra. The geometric parameters of the photonic crystals obtained as a result of the optical model analysis were found to be in good agreement with the nominal dimensions of the photonic crystal constituents. This is supported by complimentary scanning electron microscope imaging, which verified the model-calculated, nominal layer thicknesses. Conventionally, the accurate fabrication of such structures would require layer-independent print parameters, which are difficult to obtain with high precision. In this study an alternative approach is employed, using density-dependent scaling factors, introduced here for the first time. Using these scaling factors a fast and true-to-design method for the fabrication of layers with significantly different surface-to-volume ratios. The reported observations furthermore demonstrate that the location and amplitude of defect modes is extremely sensitive to any layer thickness non-uniformities in the photonic crystal structure. Considering these capabilities, one-dimensional photonic crystals engineered with defect modes can be employed as narrow band filters, for instance, while also providing a method to quantify important fabrication parameters.
Defect modes in a one-dimensional photonic crystal with a chiral defect layer
