Analysis of Defect Modes in One-Dimensional Photonic Crystal with a Dielectric-Superconducting Pair Defect

2014 ◽  
Vol 1035 ◽  
pp. 437-441
Author(s):  
Jin Xia Gao ◽  
Ji Jiang Wu

One-dimensional dielectric photonic crystals (PCs) with complex substitutional defect layers, consisting of superconducting (SC) and dielectric sublayers are theoretically studied. The influence of the incidence angle on the photonic gap spectra is theoretically analyzed. The pronounced difference in the transmittivity spectra of the PCs with right-handed (RH) and left-handed (LH) positions of the superconducting defect sublayer with respect to the dielectric defect sublayer is demonstrated. It is observed that, for the case of RH SC defect sublayer, the position of the defect mode and the transmittivity at the defect mode frequency strongly depend on the thickness of the superconducting sublayer as well as on the temperature. But the defect modes of the PCs with LH SC defect sublayer are nearly invariant upon the change of the thickness of the superconducting sublayer and the temperature.

Optics ◽  
2021 ◽  
Vol 2 (4) ◽  
pp. 284-291
Author(s):  
Victoria Paige Stinson ◽  
Serang Park ◽  
Micheal McLamb ◽  
Glenn Boreman ◽  
Tino Hofmann

One-dimensional photonic crystals composed of alternating layers with high- and low-density were fabricated using two-photon polymerization from a single photosensitive polymer for the infrared spectral range. By introducing single high-density layers to break the periodicity of the photonic crystals, a narrow-band defect mode is induced. The defect mode is located in the center of the photonic bandgap of the one-dimensional photonic crystal. The fabricated photonic crystals were investigated using infrared reflection measurements. Stratified-layer optical models were employed in the design and characterization of the spectral response of the photonic crystals. A very good agreement was found between the model-calculated and measured reflection spectra. The geometric parameters of the photonic crystals obtained as a result of the optical model analysis were found to be in good agreement with the nominal dimensions of the photonic crystal constituents. This is supported by complimentary scanning electron microscope imaging, which verified the model-calculated, nominal layer thicknesses. Conventionally, the accurate fabrication of such structures would require layer-independent print parameters, which are difficult to obtain with high precision. In this study an alternative approach is employed, using density-dependent scaling factors, introduced here for the first time. Using these scaling factors a fast and true-to-design method for the fabrication of layers with significantly different surface-to-volume ratios. The reported observations furthermore demonstrate that the location and amplitude of defect modes is extremely sensitive to any layer thickness non-uniformities in the photonic crystal structure. Considering these capabilities, one-dimensional photonic crystals engineered with defect modes can be employed as narrow band filters, for instance, while also providing a method to quantify important fabrication parameters.


2012 ◽  
Vol 2012 ◽  
pp. 1-5 ◽  
Author(s):  
Arun Kumar ◽  
Vipin Kumar ◽  
B. Suthar ◽  
A. Bhargava ◽  
Kh. S. Singh ◽  
...  

Transmission characteristics of one-dimensional photonic crystal structure with a defect have been studied. Transfer matrix method has been employed to find the transmission spectra of the proposed structure. We consider a Si/air multilayer system and refractive index of Si layer has been taken as temperature dependent. As the refractive index of Si layer is a function of temperature of medium, so the central wavelength of the defect mode is a function of temperature. Variation in temperature causes the shifting of defect modes. It is found that the average change or shift in central wavelength of defect modes is 0.064 nm/K. This property can be exploited in the design of a temperature sensor.


2013 ◽  
Vol 760-762 ◽  
pp. 378-382
Author(s):  
Jian Kun Peng ◽  
Yan Ling Han ◽  
Hong Wang

By the Transfer Matrix Method (TMM), the properties of defect modes, such as splitting, coupling and filtering, have been researched in detail. The influence of refractive index and incident angle on the defect-mode coupling has been investigated. Simulating results exhibit that coupling mode split as two defect modes when they are close to each other. This property is closely related to the refractive index and the spacing interval between defect layers. The incident angle can reach 30 degree, which has a potential application in full angle filtering.


2009 ◽  
Vol 29 (10) ◽  
pp. 2914-2919 ◽  
Author(s):  
王济洲 Wang Jizhou ◽  
熊玉卿 Xiong Yuqing ◽  
王多书 Wang Duoshu ◽  
陈焘 Chen Tao ◽  
刘宏开 Liu Hongkai

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