Selection, growth, and characterization of materials for MBE-produced x-ray optics

Author(s):  
Patrick A. Kearney ◽  
Jon M. Slaughter ◽  
Charles M. Falco
Author(s):  
Claudio Ferrari ◽  
Riccardo Lolli ◽  
Bianca Salmaso ◽  
Giovanni Pareschi ◽  
Gianpiero Tagliaferri ◽  
...  
Keyword(s):  
X Ray ◽  

2013 ◽  
Vol 19 (S2) ◽  
pp. 1782-1783
Author(s):  
J.I. Goldstein

Extended abstract of a paper presented at Microscopy and Microanalysis 2013 in Indianapolis, Indiana, USA, August 4 – August 8, 2013.


2016 ◽  
Vol 41 (2) ◽  
pp. 281 ◽  
Author(s):  
Istvan Mohacsi ◽  
Ismo Vartiainen ◽  
Manuel Guizar-Sicairos ◽  
Petri Karvinen ◽  
Vitaliy A. Guzenko ◽  
...  

2016 ◽  
Author(s):  
Frank Seiboth ◽  
Maik Kahnt ◽  
Maria Scholz ◽  
Martin Seyrich ◽  
Felix Wittwer ◽  
...  

2006 ◽  
Vol 21 (2) ◽  
pp. 91-96 ◽  
Author(s):  
Thomas N. Blanton

Characterization of materials used in the digital imaging industry has been performed using micro X-ray diffraction (microXRD) techniques. Case studies are described that demonstrate the use of microXRD for identification of phases, texture, and microstructure morphology of components used in imaging applications.


2015 ◽  
Author(s):  
Ashish Agrawal ◽  
Balwant Singh ◽  
Yogesh Kashyap ◽  
P. S. Sarkar ◽  
Mayank Shukla ◽  
...  

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