Buried interface and luminescent coupling analysis with time-resolved two-photon excitation microscopy in II-VI and III-V semiconductor heterostructures
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2016 ◽
Vol 2
(3)
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pp. 1500290
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1997 ◽
Vol 101
(24)
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pp. 4313-4321
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2016 ◽
Vol 6
(6)
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pp. 1581-1586
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