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Advanced Electronic Materials
Latest Publications
TOTAL DOCUMENTS
2513
(FIVE YEARS 1378)
H-INDEX
57
(FIVE YEARS 20)
Published By Wiley (John Wiley & Sons)
2199-160x, 2199-160x
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Latest Documents
Most Cited Documents
Contributed Authors
Related Sources
Related Keywords
Impact of Ferroelectric Domain Structure on Bulk Photovoltaic Effect of Epitaxial BiFe 1− x Co x O 3 Films
Advanced Electronic Materials
◽
10.1002/aelm.202101043
◽
2022
◽
pp. 2101043
Author(s):
Yang Chen
◽
Haoming Wei
◽
Yangqing Wu
◽
Bingqiang Cao
Keyword(s):
Domain Structure
◽
Photovoltaic Effect
◽
Ferroelectric Domain
◽
Ferroelectric Domain Structure
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Perhydropolysilazane Charge‐Trap Layer in Solution‐Processed Organic and Oxide Memory Thin‐Film Transistors
Advanced Electronic Materials
◽
10.1002/aelm.202101079
◽
2022
◽
pp. 2101079
Author(s):
Amos Amoako Boampong
◽
Sang‐Hoon Lee
◽
Jonghee Lee
◽
Yoonseuk Choi
◽
Min‐Hoi Kim
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Solution Processed
◽
Charge Trap
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Correlation between Transient Response and Neuromorphic Behavior in Organic Electrochemical Transistors
Advanced Electronic Materials
◽
10.1002/aelm.202101186
◽
2022
◽
pp. 2101186
Author(s):
Shunsuke Yamamoto
◽
Anastasios G. Polyravas
◽
Sanggil Han
◽
George G. Malliaras
Keyword(s):
Transient Response
◽
Organic Electrochemical Transistors
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Electrocaloric Coolers: A Review
Advanced Electronic Materials
◽
10.1002/aelm.202101031
◽
2022
◽
pp. 2101031
Author(s):
Alvar Torelló
◽
Emmanuel Defay
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Influence of Nanoscale Charge Trapping Layer on the Memory and Synaptic Characteristics of a Novel Rubidium Lead Chloride Quantum Dot Based Memristor
Advanced Electronic Materials
◽
10.1002/aelm.202101015
◽
2022
◽
pp. 2101015
Author(s):
Ujjal Das
◽
Pranab Kumar Sarkar
◽
Dip Das
◽
Bappi Paul
◽
Asim Roy
Keyword(s):
Quantum Dot
◽
Charge Trapping
◽
Lead Chloride
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Observation of Spin‐Induced Ferroelectricity in a Layered van der Waals Antiferromagnet CuCrP 2 S 6
Advanced Electronic Materials
◽
10.1002/aelm.202101072
◽
2022
◽
pp. 2101072
Author(s):
Chang Bae Park
◽
Aga Shahee
◽
Kwang‐Tak Kim
◽
Deepak R. Patil
◽
Sergey Alexandrovich Guda
◽
...
Keyword(s):
Van Der Waals
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Polymer‐Based Composites for Engineering Organic Memristive Devices
Advanced Electronic Materials
◽
10.1002/aelm.202101192
◽
2022
◽
pp. 2101192
Author(s):
Carlos David Prado‐Socorro
◽
Silvia Giménez‐Santamarina
◽
Lorenzo Mardegan
◽
Luis Escalera‐Moreno
◽
Henk J. Bolink
◽
...
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High‐Performance Phototransistors by Alumina Encapsulation of a 2D Semiconductor with Self‐Aligned Contacts
Advanced Electronic Materials
◽
10.1002/aelm.202100954
◽
2022
◽
pp. 2100954
Author(s):
Guangda Liang
◽
Yiming Wang
◽
Jiawei Zhang
◽
Zakhar R. Kudrynskyi
◽
Zakhar Kovalyuk
◽
...
Keyword(s):
High Performance
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Reconfigurable InSe Electronics with van der Waals Integration
Advanced Electronic Materials
◽
10.1002/aelm.202101176
◽
2022
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pp. 2101176
Author(s):
Siqi Hu
◽
Xiaoguang Luo
◽
Jinpeng Xu
◽
Qinghua Zhao
◽
Yingchun Cheng
◽
...
Keyword(s):
Van Der Waals
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Excessive Oxygen Peroxide Model‐Based Analysis of Positive‐Bias‐Stress and Negative‐Bias‐Illumination‐Stress Instabilities in Self‐Aligned Top‐Gate Coplanar In–Ga–Zn–O Thin‐Film Transistors
Advanced Electronic Materials
◽
10.1002/aelm.202101062
◽
2022
◽
pp. 2101062
Author(s):
Sungju Choi
◽
Jingyu Park
◽
Seong‐Hyun Hwang
◽
Changwook Kim
◽
Yong‐Sung Kim
◽
...
Keyword(s):
Thin Film
◽
Thin Film Transistors
◽
Negative Bias
◽
Positive Bias
◽
Bias Stress
◽
Model Based
◽
Excessive Oxygen
◽
Model Based Analysis
◽
Negative Bias Illumination Stress
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