Multi-focal imaging for improved depth of focus; principles and application to ArFi use cases (Conference Presentation)

2020 ◽  
Author(s):  
Will Conley ◽  
Josh Thornes ◽  
Paolo Alagna ◽  
Omar Zurita ◽  
Kuo-Tai Teng ◽  
...  
Keyword(s):  
Use Cases ◽  
Depth Of Focus

Record Wear Studies by Scanning Electron Microscopy

1968 ◽  
Vol 26 ◽  
pp. 364-365
Author(s):  
M.D. Coutts ◽  
E.R. Levin ◽  
J.G. Woodward
Keyword(s):  
Electron Microscopy ◽  
Constant Velocity ◽  
Peak Velocity ◽  
Great Depth ◽  
Depth Of Focus ◽  
Sweep Frequency ◽  
Transmission Electron ◽  
Test Record ◽  
Lateral Mode ◽  
Scanning Electron

While record grooves have been studied by transmission electron microscopy with replica techniques, and by optical microscopy, the former are cumbersome and restricted and the latter limited by lack of depth of focus and resolution at higher magnification. With its great depth of focus and ease in specimen manipulation, the scanning electron microscope is admirably suited for record wear studies.A special RCA sweep frequency test record was used with both lateral and vertical modulation bands. The signal is a repetitive, constant-velocity sweep from 2 to 20 kHz having a duration and repetitive rate of approximately 0.1 sec. and a peak velocity of 5.5 cm/s.A series of different pickups and numbers of plays were used on vinyl records. One centimeter discs were then cut out, mounted and coated with 200 Å of gold to prevent charging during examination. Wear studies were made by taking micrographs of record grooves having 1, 10 and 50 plays with each stylus and comparing with typical “no-play” grooves. Fig. 1 shows unplayed grooves in a vinyl pressing with sweep-frequency modulation in the lateral mode.

Use of Business Models within Model Driven Architecture

2009 ◽  
Vol 38 (38) ◽  
pp. 119-130
Author(s):  
Erika Asnina
Keyword(s):  
Business Models ◽  
Business Processes ◽  
Use Cases ◽  
Separation Of Concerns ◽  
Model Driven Architecture ◽  
Model Driven ◽  
Development Processes ◽  
Business Requirements ◽  
Complex Computer ◽  
Independent Model

Use of Business Models within Model Driven Architecture Model Driven Architecture is a framework dedicated for development of large and complex computer systems. It states and implements the principle of architectural separation of concerns. This means that a system can be modeled from three different but related to each other viewpoints. The viewpoint discussed in this paper is a Computation Independent one. MDA specification states that a model that shows a system from this viewpoint is a business model. Taking into account transformations foreseen by MDA, it should be useful for automation of software development processes. This paper discusses an essence of the Computation Independent Model (CIM) and the place of business models in the computation independent modeling. This paper considers four types of business models, namely, SBVR, BPMN, use cases and Topological Functioning Model (TFM). Business persons use SBVR to define business vocabularies and business rules of the existing and planned domains, BPMN to define business processes of both existing and planned domains, and use cases to define business requirements to the planned domain. The TFM is used to define functionality of both existing and planned domains. This paper discusses their capabilities to be used as complete CIMs with formally defined conformity between planned and existing domains.

A Decision Support Tool for Evaluating Big Data Investment in Transport: Empirical evidence from European use cases of NOESIS project

2020 ◽  
Author(s):  
Christos Katrakazas ◽  
Natalia Sobrino ◽  
Ilias Trochidis ◽  
Jose Manuel Vassallo ◽  
Stratos Arampatzis ◽  
...  
Keyword(s):  
Big Data ◽  
Decision Support ◽  
Empirical Evidence ◽  
Decision Support Tool ◽  
Use Cases ◽  
Support Tool

Use Cases and Applications of Blockchain Technology in IT Industry

2019 ◽  
Vol 7 (4) ◽  
pp. 716-720
Author(s):  
Deepak Kumar Verma ◽  
Varsha Katheria ◽  
Mazhar Khaliq
Keyword(s):  
Use Cases ◽  
It Industry ◽  
Blockchain Technology

Nanomechanical Characterization in the FIB

2005 ◽  
Author(s):  
Thomas M. Moore
Keyword(s):  
Focused Ion Beam ◽  
Ion Beam ◽  
Materials Characterization ◽  
Depth Of Focus ◽  
Ion Milling ◽  
Nano Technology ◽  
Physical Behavior ◽  
Nanomechanical Testing ◽  
Load Cells ◽  
Scanning Electron

Abstract The availability of the focused ion beam (FIB) microscope with its excellent imaging resolution, depth of focus and ion milling capability has made it an appealing platform for materials characterization at the sub-micron, or "nano" level. This article focuses on nanomechanical characterization in the FIB, which is an extension of the FIB capabilities into the realm of nano-technology. It presents examples that demonstrate the power and flexibility of nanomechanical testing in the FIB or scanning electron microscope with a probe shaft that includes a built-in strain gauge. Loads that range from grams to micrograms are achievable. Calibration is limited only by the availability of calibrated load cells in the smallest load ranges. Deflections in the range of a few nanometers range can be accurately applied. Simultaneous electrical, mechanical, and visual data can be combined to provide a revealing study of physical behavior of complex and dynamic nanostructures.

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