Fabrication and evaluation of nickel-based high-k mask for high numerical aperture extreme ultraviolet lithography

Author(s):  
Dongmin Jeong ◽  
Yoon Jong Han ◽  
Deuk Gyu Kim ◽  
Yunsoo Kim ◽  
Jinho Ahn
2019 ◽  
Vol 48 (8) ◽  
pp. 814002
Author(s):  
毛姗姗 Mao Shanshan ◽  
李艳秋 Li Yanqiu ◽  
刘 克 Liu Ke ◽  
刘丽辉 Liu Lihui ◽  
郑 猛 Zheng Meng ◽  
...  

2007 ◽  
Vol 46 (18) ◽  
pp. 3736 ◽  
Author(s):  
Regina Soufli ◽  
Russell M. Hudyma ◽  
Eberhard Spiller ◽  
Eric M. Gullikson ◽  
Mark A. Schmidt ◽  
...  

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