Sine wave artifact as a means of calibrating structured light systems

Author(s):  
Kevin G. Harding
2021 ◽  
Vol 21 (2) ◽  
pp. 1799-1808
Author(s):  
Guijin Wang ◽  
Chenchen Feng ◽  
Xiaowei Hu ◽  
Huazhong Yang

Author(s):  
Marc-Antoine Drouin ◽  
Guy Godin ◽  
Michel Picard ◽  
Jonathan Boisvert ◽  
Louis-Guy Dicaire

2004 ◽  
Vol 37 (4) ◽  
pp. 827-849 ◽  
Author(s):  
Joaquim Salvi ◽  
Jordi Pagès ◽  
Joan Batlle

2013 ◽  
Author(s):  
Tom Osborne ◽  
Vikas Ramachandra ◽  
Kalin Atanassov ◽  
Sergio Goma

Author(s):  
E. R. Eiríksson ◽  
J. Wilm ◽  
D. B. Pedersen ◽  
H. Aanæs

Structured light systems are popular in part because they can be constructed from off-the-shelf low cost components. In this paper we quantitatively show how common design parameters affect precision and accuracy in such systems, supplying a much needed guide for practitioners. Our quantitative measure is the established VDI/VDE 2634 (Part 2) guideline using precision made calibration artifacts. Experiments are performed on our own structured light setup, consisting of two cameras and a projector. We place our focus on the influence of calibration design parameters, the calibration procedure and encoding strategy and present our findings. Finally, we compare our setup to a state of the art metrology grade commercial scanner. Our results show that comparable, and in some cases better, results can be obtained using the parameter settings determined in this study.


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