White-light modeling, algorithm, development, and validation on the micro-arcsecond metrology testbed
Keyword(s):
2000 ◽
Vol 128
(9)
◽
pp. 3169-3186
◽
2011 ◽
Vol 87
(2)
◽
pp. 241-250
◽
Keyword(s):
2020 ◽
pp. 1-12
◽