Pixel cells with an arbitrary vertex angle for moire pattern reduction in contact-type multiview three-dimensional imaging systems

2005 ◽  
Author(s):  
Jung-Young Son ◽  
Vladmir V. Saveljev ◽  
Dae-Sik Kim ◽  
Kyung-Tae Kim
Keyword(s):  
Three Dimensional ◽  
Imaging Systems ◽  
Vertex Angle ◽  
Three Dimensional Imaging ◽  
Arbitrary Vertex ◽  
Contact Type ◽  
Moire Pattern ◽  
Moiré Pattern

Pixel Patterns for Voxels in Contact-Type Three Dimensional Imaging Systems

2006 ◽  
Vol 45 (2A) ◽  
pp. 798-803 ◽  
Author(s):  
Jung-Young Son ◽  
Vladmir V. Saveljev ◽  
Sung-Kyu Kim ◽  
Bahram Javidi
Keyword(s):  
Three Dimensional ◽  
Imaging Systems ◽  
Three Dimensional Imaging ◽  
Contact Type

Basic image cell in contact-type multiview three-dimensional imaging systems

2013 ◽  
Vol 52 (10) ◽  
pp. 103107 ◽  
Author(s):  
Wook-Ho Son ◽  
Jinwoong Kim ◽  
Min-Chul Park ◽  
Beom-Ryeol Lee ◽  
Jung-Young Son
Keyword(s):  
Three Dimensional ◽  
Imaging Systems ◽  
Three Dimensional Imaging ◽  
Contact Type ◽  
Basic Image

Image Mixing in Multiview Three-Dimensional Imaging Systems

2008 ◽  
Vol 4 (3) ◽  
pp. 319-323 ◽  
Author(s):  
V.V. Saveljev ◽  
Jung-Young Son ◽  
Shin-Hwan Kim ◽  
Dae-Sik Kim ◽  
Min-Chul Park ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Imaging Systems ◽  
Three Dimensional Imaging

Laser ranging and three-dimensional imaging systems based on the differential optical path method

Optik ◽  
2016 ◽  
Vol 127 (4) ◽  
pp. 2301-2307
Author(s):  
Hao Qun ◽  
Cao Jie ◽  
Hu Yao ◽  
Mu Jiaxing ◽  
Xu Jianchun ◽  
...  
Keyword(s):  
Three Dimensional ◽  
Optical Path ◽  
Imaging Systems ◽  
Laser Ranging ◽  
Three Dimensional Imaging

Three-dimensional imaging systems: a new development

1988 ◽  
Vol 27 (21) ◽  
pp. 4520 ◽  
Author(s):  
Neil Davies ◽  
Malcolm McCormick ◽  
Li Yang
Keyword(s):  
Three Dimensional ◽  
Imaging Systems ◽  
Three Dimensional Imaging ◽  
New Development

Measurement of Gingival Swelling from Dental Casts by Generation of a Moire Pattern with Laser Light

1988 ◽  
Vol 67 (8) ◽  
pp. 1118-1121 ◽  
Author(s):  
F.R. Wouters ◽  
C. Jon-And ◽  
N. Abramson ◽  
L. Olsson ◽  
L. Frithiof ◽  
...  
Keyword(s):  
Laser Light ◽  
Three Dimensional ◽  
Processing System ◽  
Measuring Method ◽  
Direct Evaluation ◽  
Moire Pattern ◽  
Moiré Pattern ◽  
Helium Neon Laser ◽  
Computer Based ◽  
Dental Casts

The aim of the study was to develop a sensitive measuring method enabling direct evaluation of gingival swelling to be made as registered on dental casts. On two separate occasions, when different degrees of severity of gingival inflammation were present in the same subject, reversible hydrocolloid impressions were taken of the mandible. The casts obtained were located successively in identical three-dimensional relationships in a field of interference fringes generated by two intersecting beams of collimated helium-neon laser light, and were photographed. The evaluation of the moiré pattern obtained directly by superimposition of the two images of the surface studied indicated that a decrease in gingival height of 0.38 mm in the direction of the camera had occurred between the two occasions. The use of a computer-based image-processing system considerably improved the visibility of the pattern. The reproducibility of the impression technique, as well as the relocation and superimposing techniques, proved satisfactory at the moiré resolution used (0.19 mm). The method has potential application in clinical experimental research, and therefore warrants further evaluation.

MoirÉ Pattern Studies of Thin Layers Deposited on (001)Si Substrates: Cases of Tisi2 and GaAs.

1989 ◽  
Vol 148 ◽  
Author(s):  
A. Rocher ◽  
X. Wallart ◽  
M.N. Charasse
Keyword(s):  
Three Dimensional ◽  
Thin Layers ◽  
Dislocation Network ◽  
Threading Dislocations ◽  
Si Substrates ◽  
Moire Pattern ◽  
Moiré Pattern ◽  
Dimensional Growth ◽  
Residual Strains

ABSTRACTMoiré pattern images have been used to investigate the crystalline quality of thin films deposited on (100)Si substrates. Observations performed on TiSi2 show a three-dimensional growth process and two different epitaxial modes. In the case of GaAs epilayers, it is shown that the residual strains are not uniformly distributed in the layer. Residual strain and threading dislocations are related to imperfections of the misfit dislocation network.

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