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The surface roughness investigation by the atomic force microscopy, x-ray scattering, and light scattering
Mapping Intimacies
◽
10.1117/12.683482
◽
2006
◽
Cited By ~ 3
Author(s):
M. L. Zanaveskin
◽
Yu. V. Grishchenko
◽
A. L. Tolstikhina
◽
V. E. Asadchikov
◽
B. S. Roshchin
◽
...
Keyword(s):
Surface Roughness
◽
Atomic Force Microscopy
◽
Light Scattering
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Related Documents
Cited By
References
Comparison of surface roughness of polished silicon wafers measured by light scattering topography, soft‐x‐ray scattering, and atomic‐force microscopy
Applied Physics Letters
◽
10.1063/1.113978
◽
1995
◽
Vol 66
(18)
◽
pp. 2346-2348
◽
Cited By ~ 64
Author(s):
C. Teichert
◽
J. F. MacKay
◽
D. E. Savage
◽
M. G. Lagally
◽
M. Brohl
◽
...
Keyword(s):
Surface Roughness
◽
Atomic Force Microscopy
◽
Light Scattering
◽
Silicon Wafers
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Comparative study of the roughness of optical surfaces and thin films using atomic force microscopy, x-ray scattering, and light scattering methods
10.1117/12.360165
◽
1999
◽
Cited By ~ 5
Author(s):
Igor V. Kozhevnikov
◽
Victor E. Asadchikov
◽
Angela Duparre
◽
Oleg N. Gilev
◽
Nikolai A. Havronin
◽
...
Keyword(s):
Thin Films
◽
Atomic Force Microscopy
◽
Light Scattering
◽
Comparative Study
◽
X Ray
◽
Force Microscopy
◽
Optical Surfaces
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
A comparison of surface roughness as measured by atomic force microscopy and x-ray scattering
Journal of Applied Physics
◽
10.1063/1.366129
◽
1997
◽
Vol 82
(6)
◽
pp. 2944-2953
◽
Cited By ~ 18
Author(s):
A. Munkholm
◽
S. Brennan
◽
E. C. Carr
Keyword(s):
Surface Roughness
◽
Atomic Force Microscopy
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Comparative study of the roughness of optical surfaces and thin films by use of x-ray scattering and atomic force microscopy
Applied Optics
◽
10.1364/ao.38.000684
◽
1999
◽
Vol 38
(4)
◽
pp. 684
◽
Cited By ~ 22
Author(s):
Victor E. Asadchikov
◽
Angela Duparré
◽
Stefan Jakobs
◽
Albert Yu. Karabekov
◽
Igor V. Kozhevnikov
◽
...
Keyword(s):
Thin Films
◽
Atomic Force Microscopy
◽
Comparative Study
◽
X Ray
◽
Force Microscopy
◽
Optical Surfaces
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Polymer meltingversuscrystallization: a combined small-angle X-ray scattering and atomic force microscopy study
Acta Crystallographica Section A Foundations of Crystallography
◽
10.1107/s0108767306098047
◽
2006
◽
Vol 62
(a1)
◽
pp. s98-s98
Author(s):
D. A. Ivanov
◽
M. Dosière
◽
M. H. J. Koch
Keyword(s):
Atomic Force Microscopy
◽
Small Angle
◽
Microscopy Study
◽
Atomic Force Microscopy Study
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Microstructure Determination of AOT + Phenol Organogels Utilizing Small-Angle X-ray Scattering and Atomic Force Microscopy
Journal of the American Chemical Society
◽
10.1021/ja0037926
◽
2001
◽
Vol 123
(10)
◽
pp. 2414-2421
◽
Cited By ~ 72
Author(s):
Blake A. Simmons
◽
Chad E. Taylor
◽
Forrest A. Landis
◽
Vijay T. John
◽
Gary L. McPherson
◽
...
Keyword(s):
Atomic Force Microscopy
◽
Small Angle
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Electrodeposited bismuth monolayers on gold (111) electrodes: comparison of surface x-ray scattering, scanning tunneling microscopy, and atomic force microscopy lattice structures
The Journal of Physical Chemistry
◽
10.1021/j100130a028
◽
1993
◽
Vol 97
(28)
◽
pp. 7290-7294
◽
Cited By ~ 75
Author(s):
Chun Hsien Chen
◽
Keith D. Kepler
◽
Andrew A. Gewirth
◽
B. M. Ocko
◽
Jia Wang
Keyword(s):
Atomic Force Microscopy
◽
Scanning Tunneling Microscopy
◽
Scanning Tunneling
◽
Lattice Structures
◽
Tunneling Microscopy
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
The structure of highly textured quasi-single-crystalline high-density polyethylene probed by atomic force microscopy and small-angle X-ray scattering
Polymer
◽
10.1016/0032-3861(95)95286-a
◽
1995
◽
Vol 36
(11)
◽
pp. 2115-2121
◽
Cited By ~ 20
Author(s):
H. Schönherr
◽
G.J. Vancso
◽
A.S. Argon
Keyword(s):
Atomic Force Microscopy
◽
Small Angle
◽
High Density Polyethylene
◽
High Density
◽
Single Crystalline
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Interface morphology in strained layer epitaxy of Si/Ge layers studied by x-ray scattering under grazing incidence and atomic force microscopy
Journal of Physics D Applied Physics
◽
10.1088/0022-3727/32/4/002
◽
1999
◽
Vol 32
(4)
◽
pp. 359-368
◽
Cited By ~ 4
Author(s):
Z Kovats
◽
T Salditt
◽
T H Metzger
◽
J Peisl
◽
T Stimpel
◽
...
Keyword(s):
Atomic Force Microscopy
◽
Grazing Incidence
◽
Interface Morphology
◽
X Ray
◽
Strained Layer
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
Nanometer surface gratings on Si(100) characterized by x-ray scattering under grazing incidence and atomic force microscopy
Journal of Applied Physics
◽
10.1063/1.363864
◽
1997
◽
Vol 81
(3)
◽
pp. 1212-1216
◽
Cited By ~ 11
Author(s):
T. H. Metzger
◽
K. Haj-Yahya
◽
J. Peisl
◽
M. Wendel
◽
H. Lorenz
◽
...
Keyword(s):
Atomic Force Microscopy
◽
Grazing Incidence
◽
X Ray
◽
Force Microscopy
◽
X Ray Scattering
◽
Atomic Force
◽
Ray Scattering
Download Full-text
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