Inspection of thin films failure: optical shearography versus electrochemical impedance spectroscopy

2008 ◽  
Author(s):  
K. Habib ◽  
F. Al-Sabti
ACS Omega ◽  
2018 ◽  
Vol 3 (6) ◽  
pp. 6880-6887
Author(s):  
Joshua Whittam ◽  
Andrew L. Hector ◽  
Christopher Kavanagh ◽  
John R. Owen ◽  
Gillian Reid

2017 ◽  
Vol 19 (38) ◽  
pp. 26310-26321 ◽  
Author(s):  
Jiapeng Liu ◽  
Francesco Ciucci

This article studies the electrochemical impedance spectroscopy response of mixed ionic-electronic conducting (MIEC) films with embedded current collectors (CCs). Even though the MIEC surface is fully exposed, the impact of the CCs can be significant.


2005 ◽  
Vol 155 (3) ◽  
pp. 569-575 ◽  
Author(s):  
M. Fall ◽  
A.A. Diagne ◽  
M.M. Dieng ◽  
F. Deflorian ◽  
S. Rossi ◽  
...  

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