Surface and interface study of SiO2-x coated InP/InGaAs/InGaAsP semiconductor laser microstructures processed in the soft KrF laser irradiation regime
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2010 ◽
Vol 42
(6-7)
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pp. 1172-1175
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1987 ◽
Vol 26
(Part 2, No. 12)
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pp. L2010-L2012
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2012 ◽
Vol 358
(17)
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pp. 2162-2165
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