Development of high quantum efficiency, flat panel, thick detectors for megavoltage x-ray imaging: A novel direct-conversion design and its feasibility

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1990 ◽  
Vol 34 ◽  
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The advent of intense synchrotron radiation sources for X-ray diffraction has made many otherwise difficult experiments feasible. The increased intensity will not he fully utilized, however, unless there are farther developments in detector technology. Improvement in detector characteristics will, of course, aid those using laboratory sources as well. For instance, construction of low noise, high, quantum efficiency detectors will reduce integration times and enable one to detect weak signals.


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