carrier trapping
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Author(s):  
Namitha Anna Koshi ◽  
Dharmapura H. K. Murthy ◽  
Sudip Chakraborty ◽  
Seung-Cheol Lee ◽  
Satadeep Bhattacharjee

Small ◽  
2021 ◽  
pp. 2102792
Author(s):  
Young Mo Sung ◽  
Tae‐Gon Kim ◽  
Dong‐Jin Yun ◽  
Mihye Lim ◽  
Dong‐Su Ko ◽  
...  

Author(s):  
Bhagyashree Mahesha Sachith ◽  
Takuya Okamoto ◽  
Sushant Ghimire ◽  
Tomokazu Umeyama ◽  
Yuta Takano ◽  
...  

Author(s):  
Haixi Pan ◽  
Liping Feng ◽  
Xiaodong Zhang ◽  
Yang Chen ◽  
Gangquan Li ◽  
...  

2021 ◽  
Author(s):  
David A. Valverde-Chávez ◽  
Esteban Rojas-Gatjens ◽  
Jacob Williamson ◽  
Sarthak Jariwala ◽  
Yangwei Shi ◽  
...  

<p>We examine the role of surface passivation on carrier trapping and nonlinear recombination dynamics in hybrid metal-halide perovskites by means of excitation correlation photoluminescence (ECPL) spectroscopy. We find that carrier trapping occurs on subnanosecond timescales in both control (unpassivated) and passivated samples, which is consistent within a shallow-trap model. However, the impact of passivation has a direct effect on both shallow and deep traps. Our results reveal that the effect of passivation of deep traps is responsible for the increase of the carrier lifetimes, while the passivation of shallow traps reduces the excitation density required for shallow-trap saturation. Our work demonstrates how ECPL provides details about the passivation of shallow traps beyond those available via conventional time-resolved photoluminescence techniques.</p>


2021 ◽  
Author(s):  
David A. Valverde-Chávez ◽  
Esteban Rojas-Gatjens ◽  
Jacob Williamson ◽  
Sarthak Jariwala ◽  
Yangwei Shi ◽  
...  

<p>We examine the role of surface passivation on carrier trapping and nonlinear recombination dynamics in hybrid metal-halide perovskites by means of excitation correlation photoluminescence (ECPL) spectroscopy. We find that carrier trapping occurs on subnanosecond timescales in both control (unpassivated) and passivated samples, which is consistent within a shallow-trap model. However, the impact of passivation has a direct effect on both shallow and deep traps. Our results reveal that the effect of passivation of deep traps is responsible for the increase of the carrier lifetimes, while the passivation of shallow traps reduces the excitation density required for shallow-trap saturation. Our work demonstrates how ECPL provides details about the passivation of shallow traps beyond those available via conventional time-resolved photoluminescence techniques.</p>


2021 ◽  
Vol 118 (11) ◽  
pp. 112105
Author(s):  
Yu Fang ◽  
Xingzhi Wu ◽  
Junyi Yang ◽  
Jianping Wang ◽  
Quanying Wu ◽  
...  
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