Generation and experimental measurement of a one‐dimensional quasi‐crystal diffraction pattern

1988 ◽  
Vol 56 (1) ◽  
pp. 72-75 ◽  
Author(s):  
S. Y. Litvin ◽  
A. B. Romberger ◽  
D. B. Litvin
Keyword(s):  
Diffraction Pattern ◽  
Experimental Measurement ◽  
One Dimensional

Experimental measurement of the Willis coupling coefficient in a one-dimensional system

2016 ◽  
Vol 140 (4) ◽  
pp. 3103-3103
Author(s):  
Michael B. Muhlestein ◽  
Caleb F. Sieck ◽  
Preston S. Wilson ◽  
Michael R. Haberman
Keyword(s):  
Experimental Measurement ◽  
Coupling Coefficient ◽  
Dimensional System ◽  
One Dimensional

Diffraction Pattern for a Class of One-Dimensional Quasicrystals

1993 ◽  
Vol 20 (2) ◽  
pp. 243-248 ◽  
Author(s):  
Xiu-Qing Huang ◽  
Dang Mo ◽  
You-Yan Liu
Keyword(s):  
Diffraction Pattern ◽  
One Dimensional

scholarly journals Effects of Domain Boundaries on the Diffraction Patterns of One Dimensional Structures

2016 ◽  
Author(s):  
Frederic Timmer ◽  
Joachim Wollschläger
Keyword(s):  
Rare Earth ◽  
Diffraction Pattern ◽  
Diffraction Theory ◽  
Model Systems ◽  
Silicide Formation ◽  
One Dimensional ◽  
Domain Boundaries ◽  
Different Types ◽  
Diffraction Patterns ◽  
Surface Technique

Motivated by diffraction experiments on the 23×3R30∘ reconstructed Si(111) due to deposition of rare earth elements (Dy, Tb) and silicide formation we analyse the splitting and non-splitting of superstructure spots. For this purpose, we model diffraction patterns for one dimensional structures generated by the binary surface technique and use supercell models to keep the analysis simple. Diffraction pattern are calculated in the framework of the kinematical diffraction theory and they are analyzed as a function of the domains and domain boundaries. Basic properties of the diffraction pattern are analyzed for model systems of a two-fold and a three-fold periodicity. The rules derived from these calculations are applied to the "real-world" system of Si(111)-(23×3R30∘)-RESi2 (RE = Dy or Tb). Depending on the combination of domains and domain boundaries of different types a plethora of different features are observed in the diffraction patterns. These are analyzed to determine the sizes of both domain boundaries and domains from experimentally observed splitting of specific superstructure spots.

Introduction to two-dimensional X-ray diffraction

2003 ◽  
Vol 18 (2) ◽  
pp. 71-85 ◽  
Author(s):  
Bob Baoping He
Keyword(s):  
Diffraction Pattern ◽  
Diffraction Data ◽  
Data Reduction ◽  
Data Interpretation ◽  
Phase Identification ◽  
Two Dimensional ◽  
X Ray Diffraction ◽  
Texture Measurement ◽  
One Dimensional ◽  
X Ray

Two-dimensional X-ray diffraction refers to X-ray diffraction applications with two-dimensional detector and corresponding data reduction and analysis. The two-dimensional diffraction pattern contains far more information than a one-dimensional profile collected with the conventional diffractometer. In order to take advantage of two-dimensional diffraction, new theories and approaches are necessary to configure the two-dimensional X-ray diffraction system and to analyze the two-dimensional diffraction data. This paper is an introduction to some fundamentals about two-dimensional X-ray diffraction, such as geometry convention, diffraction data interpretation, and advantages of two-dimensional X-ray diffraction in various applications, including phase identification, stress, and texture measurement.

scholarly journals Experimental measurement of quality factor enhancement using slow light modes in one dimensional photonic crystal

2008 ◽  
Vol 16 (8) ◽  
pp. 5585 ◽  
Author(s):  
Damian Goldring ◽  
Uriel Levy ◽  
Ido E. Dotan ◽  
Alexander Tsukernik ◽  
Mark Oksman ◽  
...  
Keyword(s):  
Photonic Crystal ◽  
Quality Factor ◽  
Experimental Measurement ◽  
Slow Light ◽  
One Dimensional ◽  
Dimensional Photonic Crystal
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