A modified thermal peak model with the source function dependent on ion velocity for materials bombarded by heavy ions

Author(s):  
I. V. Amirkhanov ◽  
A. Yu. Didyk ◽  
D. Z. Muzafarov ◽  
I. V. Puzynin ◽  
T. P. Puzynina ◽  
...  
2006 ◽  
Vol 51 (S1) ◽  
pp. S32-S43 ◽  
Author(s):  
I. V. Amirkhanov ◽  
A. Yu. Didyk ◽  
D. Z. Muzafarov ◽  
I. V. Puzynin ◽  
T. P. Puzynina ◽  
...  

1999 ◽  
Vol T80 (B) ◽  
pp. 559 ◽  
Author(s):  
N. Ishikawa ◽  
Y. Chimi ◽  
N. Kuroda ◽  
A. Iwase ◽  
T. Kambara

2021 ◽  
Vol 3 ◽  
pp. 5-20
Author(s):  
A. V. Troitskii ◽  
◽  
L. Kh. Antonova ◽  
E. I. Demikhov ◽  
T. E. Demikhov ◽  
...  

The paper considers the effect of radiation defects caused by irradiation with protons (2.5 MeV), heavy ions 132Xe27+ (167, 80, 40  MeV), 86Kr17+(107 MeV), 40Ar8+(48 MeV), on the critical parameters of HTSC-2 tapes based on compounds YBa2Cu3O7 – x and GdBa2Cu3O7 – x. The results of calculations based on the model of the thermal peak of the ion track sizes are presented. The projective ranges of ions and protons in these samples are calculated. The radiation resistance of the studied samples to ion and proton radiation of the indicated energies is determined. The performed studies made it possible to detect, at low fluences of irradiation with heavy ions, an increase in the critical current (Ic), an improvement in the adhesion between the superconducting layer and the substrate, and a decrease in internal stresses in the HTSC layer. At higher values of fluences, the critical current and critical temperature decrease. It is important that the decrease in Ic begins at lower fluences than Tc.


Author(s):  
K. F. Russell ◽  
L. L. Horton

Beams of heavy ions from particle accelerators are used to produce radiation damage in metal alloys. The damaged layer extends several microns below the surface of the specimen with the maximum damage and depth dependent upon the energy of the ions, type of ions, and target material. Using 4 MeV heavy ions from a Van de Graaff accelerator causes peak damage approximately 1 μm below the specimen surface. To study this area, it is necessary to remove a thickness of approximately 1 μm of damaged metal from the surface (referred to as “sectioning“) and to electropolish this region to electron transparency from the unirradiated surface (referred to as “backthinning“). We have developed electropolishing techniques to obtain electron transparent regions at any depth below the surface of a standard TEM disk. These techniques may be applied wherever TEM information is needed at a specific subsurface position.


1989 ◽  
Vol 50 (C2) ◽  
pp. C2-237-C2-243 ◽  
Author(s):  
H. VOIT ◽  
E. NIESCHLER ◽  
B. NEES ◽  
R. SCHMIDT ◽  
CH. SCHOPPMANN ◽  
...  

1979 ◽  
Vol 129 (10) ◽  
pp. 239 ◽  
Author(s):  
I.A. Akhiezer ◽  
L.N. Davidov
Keyword(s):  

Sign in / Sign up

Export Citation Format

Share Document