Formation and Transport of a Dense Electron Beam with Near-Rectangular Cross Section

We present new methods for patterning and controlling the cross-section of the CDW conductor niobium triselenide crystals to sub-micron dimensions using photolithography and electron beam lithography. Experiments demonstrating these techniques are presented: accurate four-probe measurement of the c-axis resistivity as a function of temperature, and measurements of width and thickness-dependent size effects on the CDW condensate. In all samples, a region with near-perfect rectangular cross-section is left to provide a control, eliminating the need to compare different samples and reduces the role of sample-to-sample variations in the analyses.

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Propagation of the intense relativistic sheet electron beam with a quasi-rectangular cross section

Acta Physica Sinica ◽

10.7498/aps.59.4626 ◽

2010 ◽

Vol 59 (7) ◽

pp. 4626

Author(s):

Du Guang-Xing ◽

Qian Bao-Liang

Keyword(s):

Electron Beam ◽

Cross Section ◽

Rectangular Cross Section ◽

Sheet Electron Beam

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Energy Distribution in Electron Beams

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100096096 ◽

1972 ◽

Vol 30 ◽

pp. 568-569

Author(s):

Tamotsu Ohno

Keyword(s):

Electron Beam ◽

Energy Distribution ◽

Cross Section ◽

Integral Curve ◽

Electron Beams ◽

Electron Gun ◽

Angular Divergence ◽

Apparent Increase ◽

Integral Width ◽

The Cross

The energy distribution in an electron; beam from an electron gun provided with a biased Wehnelt cylinder was measured by a retarding potential analyser. All the measurements were carried out with a beam of small angular divergence (<3xl0-4 rad) to eliminate the apparent increase of energy width as pointed out by Ichinokawa.The cross section of the beam from a gun with a tungsten hairpin cathode varies as shown in Fig.1a with the bias voltage Vg. The central part of the beam was analysed. An example of the integral curve as well as the energy spectrum is shown in Fig.2. The integral width of the spectrum ΔEi varies with Vg as shown in Fig.1b The width ΔEi is smaller than the Maxwellian width near the cut-off. As |Vg| is decreased, ΔEi increases beyond the Maxwellian width, reaches a maximum and then decreases. Note that the cross section of the beam enlarges with decreasing |Vg|.

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Searching for the causes why some of the paintings by Mihaly Munkacsy are darkening

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100134612 ◽

1990 ◽

Vol 48 (2) ◽

pp. 204-205

Author(s):

Imre Pozsgai ◽

Klara Erdöhalmi-Torok

Keyword(s):

Electron Beam ◽

Cross Section ◽

Polyester Resin ◽

National Gallery ◽

X Ray ◽

Art Historians ◽

Made In ◽

Grinding And Polishing

The paintings by the great Hungarian master Mihaly Munkacsy (1844-1900) made in an 8-9 years period of his activity are deteriorating. The most conspicuous sign of the deterioration is an intensive darkening. We have made an attempt by electron beam microanalysis to clarify the causes of the darkening. The importance of a study like this is increased by the fact that a similar darkening can be observed on the paintings by Munkacsy’s contemporaries e.g Courbet and Makart. A thick brown mass the so called bitumen used by Munkacsy for grounding and also as a paint is believed by the art historians to cause the darkening.For this study, paint specimens were taken from the following paintings: “Studio”, “Farewell” and the “Portrait of the Master’s Wife”, all of them are the property of the Hungarian National Gallery. The paint samples were embedded in a polyester resin “Poly-Pol PS-230” and after grinding and polishing their cross section was used for x-ray mapping.

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The use of an energy-filtering electron microscope to reduce chromatic aberration in images of thick biological specimens

Proceedings, annual meeting, Electron Microscopy Society of America ◽

10.1017/s0424820100142116 ◽

1986 ◽

Vol 44 ◽

pp. 88-91

Author(s):

L. D. Peachey ◽

J. P. Heath ◽

G. Lamprecht

Keyword(s):

Electron Microscopy ◽

Transmission Electron Microscopy ◽

Electron Beam ◽

Cross Section ◽

Electron Scattering ◽

Chromatic Aberration ◽

Image Resolution ◽

Incident Electron Energy ◽

Energy Filtering ◽

Transmission Electron

Biological specimens of cells and tissues generally are considerably thicker than ideal for high resolution transmission electron microscopy. Actual image resolution achieved is limited by chromatic aberration in the image forming electron lenses combined with significant energy loss in the electron beam due to inelastic scattering in the specimen. Increased accelerating voltages (HVEM, IVEM) have been used to reduce the adverse effects of chromatic aberration by decreasing the electron scattering cross-section of the elements in the specimen and by increasing the incident electron energy.

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