PHONON BROADENING OF IMPURITY SPECTRAL LINES: II. APPLICATION TO SILICON
Keyword(s):
The general theory of the phonon broadening of impurity spectral lines discussed in an earlier paper is applied to shallow impurity levels in silicon. With the use of a modified hydrogenic model and a deformation potential description of the electron–phonon interaction, expressions are obtained for typical contributions to the half-widths. Some numerical estimations are made for both acceptor and donor cases and are compared with experiment.
1986 ◽
Vol 138
(1)
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pp. 197-217
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2014 ◽
Vol 69
(8-9)
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pp. 497-500
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2009 ◽
Vol 1
(S1)
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pp. 775-782
Keyword(s):
1983 ◽
Vol 44
(C3)
◽
pp. C3-1565-C3-1568