Charge Transport in Dilute Aluminum Alloys

We have calculated the electrical resistivity of several dilute aluminum based alloys for which experimental data exist on the deviation from Matthiessen's rule(DMR). We take account of the anisotropy in the ideal (pure metal) scattering and its modification on adding impurities. This is a major source of DMR. In addition, we compute the effect of inelastic impurity scattering, interference between impurity and ideal scattering, Debye–Waller factors, and also the effect of mass changes on the alloy resistivity. While some of these mechanisms for DMR can be of importance under specific conditions, they should be included only after the major effect of anisotropy in the ideal scattering has been properly treated.

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Deviation from Matthiessen's Rule and Lattice Thermal Conductivity of Alloys

Australian Journal of Physics ◽

10.1071/ph590199 ◽

1959 ◽

Vol 12 (2) ◽

pp. 199 ◽

Cited By ~ 11

Author(s):

PG Klemens

Keyword(s):

Thermal Conductivity ◽

Electrical Resistivity ◽

Lattice Thermal Conductivity ◽

Pure Metal ◽

Liquid Oxygen ◽

Electronic Thermal Conductivity ◽

The Difference ◽

Matthiessen's Rule ◽

Lattice Component ◽

The Ideal

The purpose of this note is to point out that the difference in the ideal -electronic thermal conductivity between an alloy and a pure metal can be estimated from the corresponding difference in the ideal electrical resistivity, using the Wiedemann-Franz law. This allows the separation of the thermal conductivity into an electronic and a lattice component to be made with greater confidence, particularly at liquid oxygen temperatures.

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Determination of the Ideal Resistivity and of the Deviation from Matthiessen's Rule in Silver

Canadian Journal of Physics ◽

10.1139/p73-213 ◽

1973 ◽

Vol 51 (15) ◽

pp. 1602-1618 ◽

Cited By ~ 26

Author(s):

J. F. Kos

Keyword(s):

Electrical Resistivity ◽

Temperature Dependence ◽

Additional Term ◽

Precise Determination ◽

One Step ◽

Matthiessen's Rule ◽

Matthiessen’S Rule ◽

Umklapp Scattering ◽

The Ideal

Measurements of the temperature dependence of the electrical resistivity of strained and annealed samples of very pure Ag between 1.4 and 295 °K have permitted the unambiguous and precise determination of the ideal resistivity ρi and of the deviation from Matthiessen's rule ρM. Between 12 and 23 °K, ρi varies as[Formula: see text]and has been attributed to normal and umklapp scattering. Below 10 °K an additional term with a T3.86 ± 0.08 behavior appears and is attributed to one-step umklapp scattering. For samples with [Formula: see text], [Formula: see text] over the entire temperature range. Below 10 °K the variation of ρM with temperature and with defect concentration is described in terms of the theory of phonon-assisted defect scattering proposed by Klemens.

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Validity of Matthiessen's Rule for Cold-worked Wires

Australian Journal of Physics ◽

10.1071/ph530116 ◽

1953 ◽

Vol 6 (1) ◽

pp. 116 ◽

Cited By ~ 13

Author(s):

W Boas ◽

JF Nicholas

Keyword(s):

Electrical Resistivity ◽

Characteristic Temperature ◽

Wire Drawing ◽

Metals And Alloys ◽

Nickel Copper ◽

Aluminium Bronze ◽

Cold Worked ◽

Matthiessen's Rule ◽

Matthiessen’S Rule

Matthiessen's rule has been tested by, determining the slopes of the electrical resistivity-temperature curves for wires of eight common metals and alloys in various states of deformation by wire-drawing. The results show that the slope is independent of deformation, i.e. the rule is true, to within 0�5 per cent. for nickel, copper (two purities), iron, and 80/20 brass, and to within 1 per cent. for aluminium. However, for 75/25 brass and an aluminium bronze, deformations corresponding to logarithmic strains of 2�3 decrease the slopes by 1 and 3 per cent. respectively. As an explanation of this behaviour, it is suggested that deformation causes an increase in the characteristic temperature.

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The Electrical Resistivity of Monocrystalline Films Deduced From Derivation of the Mayadas-Shatzkes Equations

ElectroComponent Science and Technology ◽

10.1155/apec.3.165 ◽

1976 ◽

Vol 3 (3) ◽

pp. 165-169 ◽

Cited By ~ 5

Author(s):

C. R. Tellier ◽

A. J. Tosser

Keyword(s):

Thin Film ◽

Electrical Resistivity ◽

Approximate Expression ◽

Theoretical Expression ◽

Film Resistivity ◽

Matthiessen's Rule ◽

Matthiessen’S Rule

The theoretical expression deduced by Mola and Heras from the Mayadas–Shatzkes model of monocrystalline thin film resistivity is approximated assuming that the Sommerfeld relation is valid and introducing corrections to the Matthiessen's rule.The approximate expression of kρf /ρ0deviates from less than 6% in the 0.01–2 k-range, 0–0.5p-range and 0.1–0.62r-range.

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