Étude expérimentale de propriétés piézo-optiques du CCl4 liquide

1984 ◽  
Vol 62 (6) ◽  
pp. 548-553 ◽  
Author(s):  
J. M. St-Arnaud ◽  
T. K. Bose
Keyword(s):  
Refractive Index ◽  
High Pressures ◽  
Michelson Interferometer ◽  
Etude Expérimentale ◽  
Measuring System ◽  
Lorenz Equation ◽  
Optical Effects ◽  
Étude Expérimentale

We have developed a measuring system based on the Michelson interferometer for the determination of piezo-optical effects in liquids. The resolution of our system is about 5 parts in 107. We applied our system to the measurement of the variation of the refractive index of CCl4 at 25 °C up to 1.96 × 103 bar. We observe a slight deviation of the Lorentz–Lorenz equation at high pressures.

Étude expérimentale de propriétés piezo-optiques du CS2 en phase liquide à 273,15 et 298,15 K pour des pressions jusqu'à 140 MPa

1989 ◽  
Vol 67 (10) ◽  
pp. 957-962 ◽  
Author(s):  
A. Guerfi ◽  
J. M. St-Arnaud
Keyword(s):  
Refractive Index ◽  
Classical Theory ◽  
Michelson Interferometer ◽  
Etude Expérimentale ◽  
Electronic Polarizability ◽  
Lorenz Equation ◽  
Equation Versus ◽  
Étude Expérimentale

Using a Michelson interferometer coupled to a stabilised He–Ne laser, we measured the change of the refractive index of liquid CS2 along two isotherms, 273.15 and 298.15 K for pressures up to 140 MPa. Results show that the classical Lorentz–Lorenz equation versus the pressure varies linearly, as predicted by classical theory. Results also show that for liquid CS2 the experimental value of (8.4 ± 0.5) × 10−24 cm3, for the electronic polarizability in the range studied, is constant with pressure and temperature. Our experimental value of 8.74 × 10−24 cm3 for the electronic polarizability agrees with that found in the literature.

Determination of the Complex Refractive Index of Materials via Infrared Measurements

2002 ◽  
Vol 56 (8) ◽  
pp. 1107-1113 ◽  
Author(s):  
Christos-Platon E. Varsamis
Keyword(s):  
Refractive Index ◽  
Dielectric Function ◽  
Complex Refractive Index ◽  
Infrared Reflectance ◽  
Finite Samples ◽  
Interference Fringes ◽  
Infrared Measurements ◽  
Optical Effects ◽  
Si Wafer

In this work, methods are presented for obtaining the real, n, and imaginary, k, parts of the complex refractive index of materials considered as semi-infinite and finite from infrared reflectance, R( ν), and/or transmittance, T( ν), spectra. In semi-infinite samples, with negligible T( ν), only R( ν) is measured, and n and k can derive from the Kramers–Kronig (K–K) transformation or the modeling of the dielectric function of the material. In finite samples, the interference fringes due to multiple internal reflections can significantly alter the measured spectra. It was demonstrated that whenever the period of the fringes is on the order of a few cm−1, n and k can be equivalently obtained by the extended K–K analysis for T( ν) spectra, the modeling of the dielectric function, and the inversion of low-resolution R( ν) and T( ν) spectra, as well as the acquisition of a single high-resolution R( ν) or T( ν) spectrum. Otherwise, n and k can be calculated by modeling the dielectric function of the material once the optical effects are carefully removed. These methods were applied in infrared measurements of crystalline Si wafer and of glassy 0.20AgI·0.80[Ag2O·2B2O3].

scholarly journals LabVIEW-Based Automated Setup for Interferometric Refractive Index Probing

2019 ◽  
Vol 25 (3) ◽  
pp. 286-292 ◽  
Author(s):  
Nazariy Andrushchak ◽  
Ivan Karbovnyk
Keyword(s):  
Refractive Index ◽  
Virtual Instrument ◽  
Michelson Interferometer ◽  
Crystalline Materials ◽  
System A ◽  
Efficient Delivery ◽  
Potential Applications ◽  
Laser Light Source ◽  
Good Agreement

In the paper, we explain an automated LabVIEW-controlled setup that enables interferometric measurement of refractive indices in crystalline materials using a laser light source. The setup combines a mechanical system, a microcomputer-controlled gearless drive, a Michelson interferometer, an optical detector, a data acquisition system, and a LabVIEW virtual instrument for an accurate nondestructive determination of the refractive index of given plane-parallel samples. We explain the concept, implementation, and hardware/software peculiarities of the developed system. Test experiments on different crystals yielded results that are in good agreement with available reference data. The range of potential applications of the proposed setup extends from fundamental optical research to biophotonics instrumentation, where efficient delivery of light is of crucial importance and reliable automated probing tools are needed for optical component characterization.

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