The chemical composition fluctuation in a material may cause line broadening due to the variation of the lattice parameter, which yields a distribution of the profile centers scattered from different volumes of the material. The nature of line broadening induced by chemical heterogeneities is similar to a microstrain-like broadening in the sense that the peak width increases with the magnitude of the diffraction vector. However, the dependence of compositional broadening on the orientation of diffraction vector (i.e. the anisotropic nature of this effect) differs very much from other types of strain broadening (e.g. from that caused by dislocations). The anisotropic line broadening caused by composition fluctuation is parameterized for different crystal systems and incorporated into the evaluation procedures of peak profiles. This chapter shows that the composition probability distribution function can be determined from the moments of the experimental line profiles using the Edgeworth series. The concentration fluctuations in decomposed solid solutions can also be determined from the intensity distribution in the splitted diffraction peaks.
Controlling the carrier-envelope phase of few-cycle focused laser beams with a dispersive beam expander