CHARACTERIZATION OF NANOCRYSTALLINE SILICON FILMS BY BEAM INDUCED CURRENT IN THE SCANNING TUNNELING MICROSCOPE

2003 ◽  
Author(s):  
E. NOGALES ◽  
B. MÉNDEZ ◽  
J. PIQUERAS ◽  
R. PLUGARU
Keyword(s):  
Scanning Tunneling Microscope ◽  
Nanocrystalline Silicon ◽  
Silicon Films ◽  
Scanning Tunneling ◽  
Induced Current ◽  
Tunneling Microscope ◽  
Nanocrystalline Silicon Films

Kelvin probe and scanning tunneling microscope characterization of Langmuir–Blodgett sapphyrin films

1999 ◽  
Vol 75 (9) ◽  
pp. 1237-1239 ◽  
Author(s):  
C. Goletti ◽  
A. Sgarlata ◽  
N. Motta ◽  
P. Chiaradia ◽  
R. Paolesse ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Scanning Tunneling ◽  
Kelvin Probe ◽  
Tunneling Microscope ◽  
Langmuir Blodgett

Characterization of molecular overlayers on metal surface in dynamic equilibrium by scanning tunneling microscope

2001 ◽  
Vol 393 (1-2) ◽  
pp. 325-328 ◽  
Author(s):  
Hitoshi Suzuki ◽  
Simon Berner ◽  
Michael Brunner ◽  
Hisao Yanagi ◽  
Derck Schlettwein ◽  
...  
Keyword(s):  
Metal Surface ◽  
Scanning Tunneling Microscope ◽  
Dynamic Equilibrium ◽  
Scanning Tunneling ◽  
Tunneling Microscope

Nanometer‐scale modification and characterization of lead‐telluride surface by scanning tunneling microscope at 4.2 K

1996 ◽  
Vol 79 (5) ◽  
pp. 2435-2438
Author(s):  
D. N. Davydov ◽  
Yu. B. Lyanda‐Geller ◽  
S. A. Rykov ◽  
H. Hancotte ◽  
R. Deltour ◽  
...  
Keyword(s):  
Scanning Tunneling Microscope ◽  
Lead Telluride ◽  
Scanning Tunneling ◽  
Nanometer Scale ◽  
Tunneling Microscope
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