RECENT ADVANCES IN THE SURFACE STUDIES BY ANGLE-RESOLVED X-RAY PHOTOELECTRON DIFFRACTION

1990 ◽  
Vol 04 (13) ◽  
pp. 831-839
Author(s):  
H.C. POON

Intensity data of X-ray photoelectron spectroscopy usually show strong spatial modulations due to diffraction of photoelectrons by the surrounding atoms of the emitter. Some of the theoretical aspects and recent developments in the surface analysis by this diffraction technique will be reviewed.

2007 ◽  
Vol 111 (40) ◽  
pp. 11850-11857 ◽  
Author(s):  
Sabrina S. Jedlicka ◽  
Jenna L. Rickus ◽  
Dmitry Y. Zemlyanov

2017 ◽  
Vol 3 (6) ◽  
pp. 882-889 ◽  
Author(s):  
Efrat Korin ◽  
Natalya Froumin ◽  
Smadar Cohen

2009 ◽  
Vol 48 (9) ◽  
pp. 092304 ◽  
Author(s):  
Susumu Takabayashi ◽  
Keishi Okamoto ◽  
Tatsuyuki Nakatani ◽  
Hiroyuki Sakaue ◽  
Takayuki Takahagi

1986 ◽  
Vol 27 (1) ◽  
pp. 93-105 ◽  
Author(s):  
R. Jerome ◽  
Ph. Teyssie ◽  
J.J. Pireaux ◽  
J.J. Verbist

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