AN INTERMITTENTLY USED SYSTEM WITH PREPARATION TIME FOR THE REPAIR FACILITY

Author(s):  
V. S. S. YADAVALLI ◽  
S. J. CLAASEN ◽  
S. UDAYABASKARAN ◽  
S. GEETHA

Two models of an intermittently used system with preparation time for the repair facility are considered. Mean stationary rate of the disappointments, the joint probability that disappointments do not occur at specified intervals are obtained for both the models.

2019 ◽  
Vol 2 (1) ◽  
pp. 5-14
Author(s):  
VIJAY VIR SINGH ◽  
PRAVEEN KUMAR POONIA

This paper deals with the reliability analysis of a complex system consisting ofa two dissimilar unit’ in a parallel configuration with correlated lifetime distribution. The system stops functioning when both units stop working. Both units are inspected periodically as well as being examined before assigning to repair facility. Under consideration of the system have two states: Normal and failed. Regenerative point technique has been used for the mathematical formulation of the model. The system is analyzed using Laplace transforms to solve the mathematical equations. Reliability, Availability, MTSF, Busy Period of repairmen and Cost-effectiveness of the system has been computed. The computed results have been demonstrated by tables and graphs. The repair time of both the units follows the negative exponential distribution with different parameters in a joint probability density function. The inspection times are assumed to follow the general distribution. Some particular cases of the system have also been derived from seeing the practical importance of the model.


Author(s):  
G. M. Greene ◽  
J. W. Sprys

The present study demonstrates that fracture surfaces appear strikingly different when observed in the transmission electron microscope by replication and in the scanning electron microscope by backscattering and secondary emission. It is important to know what form these differences take because of the limitations of each instrument. Replication is useful for study of surfaces too large for insertion into the S.E.M. and for resolution of fine detail at high magnification with the T.E.M. Scanning microscopy reduces sample preparation time and allows large sections of the actual surface to be viewed.In the present investigation various modes of the S.E.M. along with the transmission mode in the T.E.M. were used to study one area of a fatigue surface of a low carbon steel. Following transmission study of a platinum carbon replica in the T.E.M. and S.E.M. the replica was coated with a gold layer approximately 200A° in thickness to improve electron emission.


1989 ◽  
Vol 28 (03) ◽  
pp. 160-167 ◽  
Author(s):  
P. Penczek ◽  
W. Grochulski

Abstract:A multi-level scheme of syntactic reduction of the epileptiform EEG data is briefly discussed and the possibilities it opens up in describing the dynamic behaviour of a multi-channel system are indicated. A new algorithm for the inference of a Markov network from finite sets of sample symbol strings is introduced. Formulae for the time-dependent state occupation probabilities, as well as joint probability functions for pairs of channels, are given. An exemplary case of analysis in these terms, taken from an investigation of anticonvulsant drug effects on EEG seizure patterns, is presented.


Author(s):  
V. Yeliseyev ◽  
O. Bondarenko ◽  
O. Kovaliov

The scientific article explores the issues of managing the risks of emergencies in order to improve the readiness and efficiency of the functioning of a single state civil protection system.When calculating the risks, the basic quantitative criteria take into account the probability of emergencies and the magnitude of the damage from these situations.The article presents a method for calculating the joint probability of the action of several emergency factors, taking into account the effect of accumulation of damage.


2010 ◽  
Vol 42 (3) ◽  
pp. 367-376
Author(s):  
Si-Lin HUANG ◽  
Chong-De LIN ◽  
Qing-Fen HU ◽  
Liang LUO ◽  
Guang CHEN

2013 ◽  
Author(s):  
Domenico Mignacca ◽  
Corrado Campodonico ◽  
Davide Tedeschi
Keyword(s):  

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