Test Environment-Dependent Discrete Binomial-Type Software Reliability Models

Author(s):  
Shinji Inoue ◽  
Shigeru Yamada

We have no doubt that the software reliability growth process in the testing phase depends on the test environment factors, such as the attained testing coverage, the number of test-runs and the debugging skills, which affect the software failure occurrence or fault detection phenomenon in the testing phase. In this paper, we propose software reliability models that consider the effects of the testing environment factors. Our models are developed by a program size-dependent discrete binomial-type software reliability modeling approach. This modeling approach is also consistent with software reliability data collection and enables us to consider the effect of the program size. Finally, we compare the accuracy of our models in terms of mean square errors (MSE) and Akaike’s information criterion (AIC) with the existing corresponding model by using actual data.

Author(s):  
Shinji Inoue ◽  
Shigeru Yamada

Reflecting the software fault debugging procedure or environment of testing activities on software reliability models is often discussed as the approaches for improving assessment accuracy for model-based reliability assessment. We discuss a modeling approach reflecting software debugging procedure based on phase-type modeling scheme and propose probability models for software reliability measurement. Further, we give brief consideration for the usefulness of this modeling approach by using a few data sets.


1997 ◽  
Vol 29 (2) ◽  
pp. 337-352 ◽  
Author(s):  
Yiping Chen ◽  
Nozer D. Singpurwalla

Assessing the reliability of computer software has been an active area of research in computer science for the past twenty years. To date, well over a hundred probability models for software reliability have been proposed. These models have been motivated by seemingly unrelated arguments and have been the subject of active debate and discussion. In the meantime, the search for an ideal model continues to be pursued. The purpose of this paper is to point out that practically all the proposed models for software reliability are special cases of self-exciting point processes. This perspective unifies the very diverse approaches to modeling reliability growth and provides a common structure under which problems of software reliability can be discussed.


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