Effects of High Polymer Concentration for Alignment of Liquid Crystal on Rubbed Polyimide Surfaces Containing Trifluoromethyl Moieties

1995 ◽  
Vol 34 (Part 2, No. 6B) ◽  
pp. L786-L788 ◽  
Author(s):  
Dae-Shik Seo ◽  
Shunsuke Kobayashi
Keyword(s):  
Liquid Crystal ◽  
Polymer Concentration ◽  
High Polymer

Nanoparticle Assembly in High Polymer Concentration Solutions Increases Superlattice Stability

Small ◽  
2021 ◽  
pp. 2102107
Author(s):  
Margaret S. Lee ◽  
Alfredo Alexander‐Katz ◽  
Robert J. Macfarlane
Keyword(s):  
Polymer Concentration ◽  
Nanoparticle Assembly ◽  
High Polymer

Rheological behaviors of PVA/H2O solutions of high-polymer concentration

2009 ◽  
pp. NA-NA ◽  
Author(s):  
Han-Wen Gao ◽  
Rong-Jie Yang ◽  
Ji-Yu He ◽  
Lei Yang
Keyword(s):  
Polymer Concentration ◽  
High Polymer ◽  
Rheological Behaviors

High-Polymer-Content Liquid-Crystal/Liquid-Crystalline-Polymer (LC/LCP) Composite

1999 ◽  
Vol 30 (1) ◽  
pp. 656
Author(s):  
Munekazu Date ◽  
Yoshie Koshiishi ◽  
Yoshie Takeuchi ◽  
Kinya Kato
Keyword(s):  
Liquid Crystal ◽  
Liquid Crystalline Polymer ◽  
Liquid Crystalline ◽  
Crystalline Polymer ◽  
Polymer Content ◽  
High Polymer

Computer averaging of lattice images of poly-4-methyl-pentene-1 (P4mp1): Noise created artifacts

1987 ◽  
Vol 45 ◽  
pp. 388-389
Author(s):  
P. Pradère ◽  
J.F. Revol ◽  
R. St. John Manley
Keyword(s):  
Low Dose ◽  
Polymer Concentration ◽  
Processing System ◽  
Limiting Factor ◽  
Dilute Solution ◽  
New Techniques ◽  
Dose Unit ◽  
Lattice Images ◽  
Dose Imaging ◽  
Imaging Conditions

Although radiation damage is the limiting factor in HREM of polymers, new techniques based on low dose imaging at low magnification have permitted lattice images to be obtained from very radiation sensitive polymers such as polyethylene (PE). This paper describes the computer averaging of P4MP1 lattice images. P4MP1 is even more sensitive than PE (total end point dose of 27 C m-2 as compared to 100 C m-2 for PE at 120 kV). It does, however, have the advantage of forming flat crystals from dilute solution and no change in d-spacings is observed during irradiation.Crystals of P4MP1 were grown at 60°C in xylene (polymer concentration 0.05%). Electron microscopy was performed with a Philips EM 400 T microscope equipped with a Low Dose Unit and operated at 120 kV. Imaging conditions were the same as already described elsewhere. Enlarged micrographs were digitized and processed with the Spider image processing system.

Freeze-fracture TEM of the helical smectic A* phase

1992 ◽  
Vol 50 (1) ◽  
pp. 278-279
Author(s):  
K.J. Ihn ◽  
R. Pindak ◽  
J. A. N. Zasadzinski
Keyword(s):  
Liquid Crystal ◽  
Grain Boundary ◽  
Grain Boundaries ◽  
Freeze Fracture ◽  
Smectic Phase ◽  
Layer Spacing ◽  
Screw Dislocations ◽  
Smectic A ◽  
Smectic Phases ◽  
Discrete Amount

A new liquid crystal (called the smectic-A* phase) that combines cholesteric twist and smectic layering was a surprise as smectic phases preclude twist distortions. However, the twist grain boundary (TGB) model of Renn and Lubensky predicted a defect-mediated smectic phase that incorporates cholesteric twist by a lattice of screw dislocations. The TGB model for the liquid crystal analog of the Abrikosov phase of superconductors consists of regularly spaced grain boundaries of screw dislocations, parallel to each other within the grain boundary, but rotated by a fixed angle with respect to adjacent grain boundaries. The dislocations divide the layers into blocks which rotate by a discrete amount, Δθ, given by the ratio of the layer spacing, d, to the distance between grain boundaries, lb; Δθ ≈ d/lb (Fig. 1).

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