Evaluation ofC15TCNQLangmuir-Blodgett Ultrathin Films on Aluminum Thin Films by Attenuated Total Reflection Measurements

1996 ◽  
Vol 35 (Part 1, No. 10) ◽  
pp. 5466-5470 ◽  
Author(s):  
Keizo Kato ◽  
Yusuke Aoki ◽  
Kenichi Ohashi ◽  
Kazunari Shinbo ◽  
Futao Kaneko
Keyword(s):  
Thin Films ◽  
Ultrathin Films ◽  
Total Reflection ◽  
Attenuated Total Reflection

Attenuated total reflection properties and structures in spiropyran LB thin films

1996 ◽  
Vol 284-285 ◽  
pp. 420-423 ◽  
Author(s):  
Keizo Kato ◽  
Hitoshi Saiki ◽  
Hisashi Okuchi ◽  
Futao Kaneko ◽  
Takashi Wakamatsu ◽  
...  
Keyword(s):  
Thin Films ◽  
Total Reflection ◽  
Attenuated Total Reflection

Enhanced photoluminescence spectroscopy for thin films using the attenuated total reflection method

2011 ◽  
Vol 50 (5) ◽  
pp. 696 ◽  
Author(s):  
Takashi Wakamatsu ◽  
Tadaaki Kitami ◽  
Tomoaki Maruyama ◽  
Susumu Toyoshima
Keyword(s):  
Thin Films ◽  
Total Reflection ◽  
Attenuated Total Reflection ◽  
Photoluminescence Spectroscopy ◽  
Reflection Method ◽  
Enhanced Photoluminescence

p-polarized infrared attenuated total reflection study of InN thin films grown on Si(111) substrate

2010 ◽  
Vol 4 (8-9) ◽  
pp. 191-193 ◽  
Author(s):  
S. S. Ng ◽  
S. C. Lee ◽  
P. K. Ooi ◽  
Z. Hassan ◽  
H. Abu Hassan ◽  
...  
Keyword(s):  
Thin Films ◽  
Total Reflection ◽  
Attenuated Total Reflection
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