A Novel Graphical Analysis Method for Double Crystal X-Ray Diffraction Measurements of Strained Layer Superlattices Grown on (100) Substrate

1997 ◽  
Vol 36 (Part 1, No. 8) ◽  
pp. 5351-5355 ◽  
Author(s):  
Kiichi Nakashima ◽  
Hideo Sugiura
Keyword(s):  
Graphical Analysis ◽  
Analysis Method ◽  
X Ray Diffraction ◽  
Double Crystal ◽  
X Ray ◽  
Strained Layer ◽  
Strained Layer Superlattices

X‐ray diffraction analysis of buffer layer effects on lattice distortions of strained layer superlattices

1987 ◽  
Vol 62 (3) ◽  
pp. 1124-1127 ◽  
Author(s):  
K. Kamigaki ◽  
H. Sakashita ◽  
H. Kato ◽  
M. Nakayama ◽  
N. Sano ◽  
...  
Keyword(s):  
Diffraction Analysis ◽  
Buffer Layer ◽  
X Ray Diffraction ◽  
X Ray ◽  
Strained Layer ◽  
Lattice Distortions ◽  
Strained Layer Superlattices
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