Local Surface Potential Measurements of Carbon Nanotube FETs by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.44.1633 ◽

2005 ◽

Vol 44 (4A) ◽

pp. 1633-1636 ◽

Author(s):

Yuji Miyato ◽

Kei Kobayashi ◽

Kazumi Matsushige ◽

Hirofumi Yamada

Keyword(s):

Carbon Nanotube ◽

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Local Surface ◽

Kelvin Probe ◽

Force Microscopy ◽

Surface Potential Measurements ◽

Carbon Nanotube Fets

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Surface Potential Measurement of Carbon Nanotube FETs using Kelvin Probe Force Microscopy

10.7567/ssdm.2006.a-6-5 ◽

2006 ◽

Author(s):

T. Umesaka ◽

H. Ohnaka ◽

Y. Ohno ◽

S. Kishimoto ◽

K. Maezawa ◽

...

Keyword(s):

Carbon Nanotube ◽

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Potential Measurement ◽

Force Microscopy ◽

Carbon Nanotube Fets

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Surface potential measurements of AlGaN∕GaN high-electron-mobility transistors by Kelvin probe force microscopy

Applied Physics Letters ◽

10.1063/1.1835551 ◽

2004 ◽

Vol 85 (24) ◽

pp. 6028-6029 ◽

Author(s):

Kohei Nakagami ◽

Yutaka Ohno ◽

Shigeru Kishimoto ◽

Koichi Maezawa ◽

Takashi Mizutani

Keyword(s):

Surface Potential ◽

Electron Mobility ◽

High Electron Mobility Transistors ◽

Kelvin Probe Force Microscopy ◽

High Electron ◽

Kelvin Probe ◽

High Electron Mobility ◽

Force Microscopy ◽

Electron Mobility Transistors ◽

Surface Potential Measurements

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Dual harmonic Kelvin probe force microscopy for surface potential measurements of ferroelectrics

Proceedings of ISAF-ECAPD-PFM 2012 ◽

10.1109/isaf.2012.6297845 ◽

2012 ◽

Author(s):

L. Collins ◽

J. I. Kilpatrick ◽

M. Bhaskaran ◽

S. Sriram ◽

S. A. L. Weber ◽

...

Keyword(s):

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Surface Potential Measurements

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Inside Front Cover: Quantitative Measurement of the Local Surface Potential of π-Conjugated Nanostructures: A Kelvin Probe Force Microscopy Study (Adv. Funct. Mater. 11/2006)

Advanced Functional Materials ◽

10.1002/adfm.200690041 ◽

2006 ◽

Vol 16 (11) ◽

pp. NA-NA

Author(s):

A. Liscio ◽

V. Palermo ◽

D. Gentilini ◽

F. Nolde ◽

K. Müllen ◽

...

Keyword(s):

Surface Potential ◽

Quantitative Measurement ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Local Surface ◽

Kelvin Probe ◽

Front Cover ◽

Force Microscopy

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Applying Second and Third Resonance Frequencies to Surface Potential Measurements with Kelvin Probe Force Microscopy

e-Journal of Surface Science and Nanotechnology ◽

10.1380/ejssnt.2018.339 ◽

2018 ◽

Vol 16 (0) ◽

pp. 339-342 ◽

Author(s):

Akinori Honda ◽

Hiroshi Itoh

Keyword(s):

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Resonance Frequencies ◽

Surface Potential Measurements

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Surface potential measurements of 2 × 1 reconstructed Si(001) using UHV Kelvin probe force microscopy

Surface Science ◽

10.1016/j.susc.2015.05.006 ◽

2015 ◽

Vol 641 ◽

pp. 16-22 ◽

Author(s):

Sangyeob Lee

Keyword(s):

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Surface Potential Measurements

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Present State of the Surface Potential Measurements by Kelvin Force Microscopy. Potential Measurement of Si Nano-structures by Kelvin Probe Force Microscopy.

Hyomen Kagaku ◽

10.1380/jsssj.22.301 ◽

2001 ◽

Vol 22 (5) ◽

pp. 301-308

Author(s):

Michiharu TABE ◽

Takahiro KAWASAKI ◽

Takafumi KAMIMURA ◽

Yasuhiko ISHIKAWA ◽

Takeshi MIZUNO

Keyword(s):

Surface Potential ◽

Present State ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Potential Measurement ◽

Force Microscopy ◽

Nano Structures ◽

Surface Potential Measurements

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Tip−Sample Interactions in Kelvin Probe Force Microscopy: Quantitative Measurement of the Local Surface Potential

The Journal of Physical Chemistry C ◽

10.1021/jp806657k ◽

2008 ◽

Vol 112 (44) ◽

pp. 17368-17377 ◽

Author(s):

Andrea Liscio ◽

Vincenzo Palermo ◽

Klaus Müllen ◽

Paolo Samorì

Keyword(s):

Surface Potential ◽

Quantitative Measurement ◽

Kelvin Probe Force Microscopy ◽

Local Surface ◽

Kelvin Probe ◽

Force Microscopy

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Lateral Averaging Effects on Surface Potential Measurements on InAs Dots Studied by Kelvin Probe Force Microscopy

Japanese Journal of Applied Physics ◽

10.1143/jjap.43.4639 ◽

2004 ◽

Vol 43 (7B) ◽

pp. 4639-4642 ◽

Author(s):

Shiano Ono ◽

Takuji Takahashi

Keyword(s):

Surface Potential ◽

Kelvin Probe Force Microscopy ◽

Kelvin Probe ◽

Force Microscopy ◽

Surface Potential Measurements

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Quantitative Measurement of the Local Surface Potential of π-Conjugated Nanostructures: A Kelvin Probe Force Microscopy Study

Advanced Functional Materials ◽

10.1002/adfm.200600145 ◽

2006 ◽

Vol 16 (11) ◽

pp. 1407-1416 ◽

Author(s):

A. Liscio ◽

V. Palermo ◽

D. Gentilini ◽

F. Nolde ◽

K. Müllen ◽

...

Keyword(s):

Surface Potential ◽

Quantitative Measurement ◽

Microscopy Study ◽

Kelvin Probe Force Microscopy ◽

Local Surface ◽

Kelvin Probe ◽

Force Microscopy

Download Full-text