Surface potential measurements of AlGaN∕GaN high-electron-mobility transistors by Kelvin probe force microscopy

2004 ◽  
Vol 85 (24) ◽  
pp. 6028-6029 ◽  
Author(s):  
Kohei Nakagami ◽  
Yutaka Ohno ◽  
Shigeru Kishimoto ◽  
Koichi Maezawa ◽  
Takashi Mizutani
Keyword(s):  
Surface Potential ◽  
Electron Mobility ◽  
High Electron Mobility Transistors ◽  
Kelvin Probe Force Microscopy ◽  
High Electron ◽  
Kelvin Probe ◽  
High Electron Mobility ◽  
Force Microscopy ◽  
Electron Mobility Transistors ◽  
Surface Potential Measurements

Low-Frequency Noise Investigation of AlGaN/GaN High-Electron-Mobility Transistors

2021 ◽  
pp. 108050
Author(s):  
Maria Glória Caño de Andrade ◽  
Luis Felipe de Oliveira Bergamim ◽  
Braz Baptista Júnior ◽  
Carlos Roberto Nogueira ◽  
Fábio Alex da Silva ◽  
...  
Keyword(s):  
Electron Mobility ◽  
Low Frequency ◽  
High Electron Mobility Transistors ◽  
Frequency Noise ◽  
High Electron ◽  
Low Frequency Noise ◽  
High Electron Mobility ◽  
Electron Mobility Transistors
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