Characterization of Local Current Leakage in La2O3–Al2O3Composite Films by Conductive Atomic Force Microscopy

2006 ◽  
Vol 45 (4B) ◽  
pp. 2954-2960 ◽  
Author(s):  
Akiyoshi Seko ◽  
Toshifumi Sago ◽  
Mitsuo Sakashita ◽  
Akira Sakai ◽  
Masaki Ogawa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Current Leakage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Current

Behavior of Local Current Leakage in Stressed Gate SiO2Films Analyzed by Conductive Atomic Force Microscopy

2004 ◽  
Vol 43 (7B) ◽  
pp. 4683-4686 ◽  
Author(s):  
Akiyoshi Seko ◽  
Yukihiko Watanabe ◽  
Hiroki Kondo ◽  
Akira Sakai ◽  
Shigeaki Zaima ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Conductive Atomic Force Microscopy ◽  
Current Leakage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Local Current

Local Current Leakage Characterization in La2O3-Al2O3 Composite Films by Conductive Atomic Force Microscopy

2005 ◽  
Author(s):  
Akiyoshi Seko ◽  
Toshifumi Sago ◽  
Mitsuo Sakashita ◽  
Akira Sakai ◽  
Masaki Ogawa ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Composite Films ◽  
Conductive Atomic Force Microscopy ◽  
Current Leakage ◽  
Force Microscopy ◽  
Atomic Force ◽  
Al2o3 Composite ◽  
Local Current

Electrical characterization of ZnO multilayer varistors on the nanometre scale with conductive atomic force microscopy

2010 ◽  
Vol 30 (7) ◽  
pp. 1761-1764 ◽  
Author(s):  
Martin Schloffer ◽  
Christian Teichert ◽  
Peter Supancic ◽  
Andrei Andreev ◽  
Yue Hou ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Electrical Characterization of Bismuth Sulfide Nanowire Arrays by Conductive Atomic Force Microscopy

2008 ◽  
Vol 112 (49) ◽  
pp. 19680-19685 ◽  
Author(s):  
Pavels Birjukovs ◽  
Nikolay Petkov ◽  
Ju Xu ◽  
Janis Svirksts ◽  
John J. Boland ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Nanowire Arrays ◽  
Bismuth Sulfide ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force

Electrical characterization of HgTe nanowires using conductive atomic force microscopy

2010 ◽  
Vol 108 (11) ◽  
pp. 114308 ◽  
Author(s):  
P. Gundersen ◽  
K. O. Kongshaug ◽  
E. Selvig ◽  
R. Haakenaasen
Keyword(s):  
Atomic Force Microscopy ◽  
Electrical Characterization ◽  
Conductive Atomic Force Microscopy ◽  
Force Microscopy ◽  
Atomic Force
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