Decreasing Dark Current of Complementary Metal Oxide Semiconductor Image Sensors by New Postmetallization Annealing and Ultraviolet Curing

2008 ◽  
Vol 47 (1) ◽  
pp. 139-141 ◽  
Author(s):  
Jongwan Jung ◽  
Doo-Won Kwon ◽  
Jinho Kim
2008 ◽  
Vol 47 (7) ◽  
pp. 5390-5395 ◽  
Author(s):  
Koichi Mizobuchi ◽  
Satoru Adachi ◽  
Jose Tejada ◽  
Hiromichi Oshikubo ◽  
Nana Akahane ◽  
...  

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