Nondestructive Testing Technique for Defect Detection in LiNbO3Using Infrared Thermal Imaging Camera

2010 ◽  
Vol 49 (7) ◽  
pp. 07HB07 ◽  
Author(s):  
Kunyong Lee ◽  
Hisashi Miyazaki ◽  
Yoichi Okamoto ◽  
Jun Morimoto ◽  
Kohji Toda
Keyword(s):  
Nondestructive Testing ◽  
Defect Detection ◽  
Thermal Imaging ◽  
Testing Technique ◽  
Infrared Thermal Imaging ◽  
Thermal Imaging Camera ◽  
Imaging Camera

New infrared thermal imaging camera diagnostic

1997 ◽  
Vol 68 (1) ◽  
pp. 971-973 ◽  
Author(s):  
M. Ciotti ◽  
C. Alessandrini ◽  
A. De Angelis ◽  
V. Vitale ◽  
S. Bernd ◽  
...  
Keyword(s):  
Thermal Imaging ◽  
Infrared Thermal Imaging ◽  
Thermal Imaging Camera ◽  
Imaging Camera

Characterization of Defects in Semi-Insulating 6H-SiC Substrates Using IR Thermal Imaging Camera

2010 ◽  
Vol 645-648 ◽  
pp. 559-562 ◽  
Author(s):  
Kun Yong Lee ◽  
Hisashi Miyazaki ◽  
Yoichi Okamoto ◽  
Jun Morimoto
Keyword(s):  
Thermal Imaging ◽  
Infrared Thermal Imaging ◽  
Ir Camera ◽  
Thermal Imaging Camera ◽  
Long Wavelength ◽  
Macro Scale ◽  
Imaging Camera ◽  
Thermal Influence ◽  
Scale 8 ◽  
Non Destructive

We have detected defects micro-pipes and a cluster of impurities in semi-insulating 6H-SiC substrates using long-wavelength infrared thermal imaging camera (IR-camera) with 8 ~ 14 µm in non-destructive and non-contact. Also we have evaluated the thermal influence of defects on the entire substrates from the observation results of scanning laser microscope (SLM) and light scattering tomography (LST). Through the process, it was certificated that the defects in the substrates could be detected with relatively macroscopic scale (8  6 mm2). Moreover, through a temperature profile processing by a 0.1 K thermal resolution, we estimated thermal behavior of the defect areas in the 6H-SiC precisely. The IR-camera is considered as effective technique for evaluating the defects in the intermediate range between micro and macro scale.

scholarly journals Responsivity and Noise Evaluation of Infrared Thermal Imaging Camera

2013 ◽  
Vol 33 (4) ◽  
pp. 342-348 ◽  
Author(s):  
Dong-Ik Kim ◽  
Ghiseok Kim ◽  
Geon-Hee Kim ◽  
Ki Soo Chang
Keyword(s):  
Thermal Imaging ◽  
Infrared Thermal Imaging ◽  
Thermal Imaging Camera ◽  
Imaging Camera ◽  
Noise Evaluation

scholarly journals Development of Calibration Target for Infrared Thermal Imaging Camera

2014 ◽  
Vol 34 (3) ◽  
pp. 248-253 ◽  
Author(s):  
Su Un Kim ◽  
Man Yong Choi ◽  
Jeong Hak Park ◽  
Kwang Yong Shin ◽  
Eui Chul Lee
Keyword(s):  
Thermal Imaging ◽  
Calibration Target ◽  
Infrared Thermal Imaging ◽  
Thermal Imaging Camera ◽  
Imaging Camera
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