A simple modeling method for mobile password schemes and its analysis

2011 ◽  
Author(s):  
Sung-Hwan Kim ◽  
Kwanghwi Kim ◽  
Hwan-Gue Cho
Keyword(s):  
Modeling Method ◽  
Its Analysis ◽  
Simple Modeling

scholarly journals APPLICATION OF SIMPLE MODELING METHOD TO RETAINING WALL WITH ELASTO-PLASTIC PROPERTY

2016 ◽  
Vol 81 (730) ◽  
pp. 1993-2003
Author(s):  
Tetsushi INUBUSHI ◽  
Yuji MIYAMOTO ◽  
Takahisa ENOMOTO ◽  
Tadamichi YAMASHITA
Keyword(s):  
Retaining Wall ◽  
Plastic Property ◽  
Modeling Method ◽  
Simple Modeling

Light Optical Diffraction Studies of Macromolecular Ultrastructure

1970 ◽  
Vol 28 ◽  
pp. 258-259
Author(s):  
Glen B. Haydon
Keyword(s):  
High Resolution ◽  
Diffraction Analysis ◽  
Diffraction Pattern ◽  
Electron Micrographs ◽  
Optical Diffraction ◽  
Electron Micrograph ◽  
Its Analysis ◽  
Resolution Electron ◽  
Diffraction Patterns

Analysis of light optical diffraction patterns produced by electron micrographs can easily lead to much nonsense. Such diffraction patterns are referred to as optical transforms and are compared with transforms produced by a variety of mathematical manipulations. In the use of light optical diffraction patterns to study periodicities in macromolecular ultrastructures, a number of potential pitfalls have been rediscovered. The limitations apply to the formation of the electron micrograph as well as its analysis.(1) The high resolution electron micrograph is itself a complex diffraction pattern resulting from the specimen, its stain, and its supporting substrate. Cowley and Moodie (Proc. Phys. Soc. B, LXX 497, 1957) demonstrated changing image patterns with changes in focus. Similar defocus images have been subjected to further light optical diffraction analysis.

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