scholarly journals Double Swing Quiescent-Current: An Experimental Detection Method of Ferroelectricity in Very Leaky Dielectric Films

2020 ◽  
Vol 97 (1) ◽  
pp. 3-6
Author(s):  
Salvador Dueñas ◽  
Helena Castán ◽  
Óscar G. Ossorio ◽  
Guillermo Vinuesa ◽  
Héctor García ◽  
...  
Keyword(s):  
Detection Method ◽  
Dielectric Films ◽  
Experimental Detection ◽  
Quiescent Current ◽  
Leaky Dielectric

scholarly journals Double Swing Quiescent-Current: An Experimental Detection Method of Ferroelectricity in Very Leaky Dielectric Films

2020 ◽  
Vol MA2020-01 (15) ◽  
pp. 1016-1016
Author(s):  
Salvador Dueñas ◽  
Helena Castán ◽  
Óscar G. Ossorio ◽  
Guillermo Vinuesa ◽  
Héctor García ◽  
...  
Keyword(s):  
Detection Method ◽  
Dielectric Films ◽  
Experimental Detection ◽  
Quiescent Current ◽  
Leaky Dielectric

Electrically induced pattern formation in thin leaky dielectric films

2005 ◽  
Vol 17 (3) ◽  
pp. 032104 ◽  
Author(s):  
R. V. Craster ◽  
O. K. Matar
Keyword(s):  
Pattern Formation ◽  
Dielectric Films ◽  
Leaky Dielectric

Accurate experimental detection method for characterizing superoscillatory lenses made from multiannular metasurfaces

2018 ◽  
Vol 57 (01) ◽  
pp. 1 ◽  
Author(s):  
Tong Wang ◽  
Tao Liu ◽  
Shuming Yang ◽  
Qiang Liu ◽  
Biyao Cheng
Keyword(s):  
Detection Method ◽  
Experimental Detection

scholarly journals TWO PHASE FLOW EXPERIMENTAL DETECTION METHOD AND CFD MODELS – A REVIEW

2020 ◽  
Vol 24 (05) ◽  
pp. 9-18
Author(s):  
Hilal Mohammed Mousa ◽  
◽  
Sadiq Salman Muhsun ◽  
Zainab Talib Al-Sharify ◽  
◽  
...  
Keyword(s):  
Two Phase Flow ◽  
Detection Method ◽  
Phase Flow ◽  
Two Phase ◽  
Cfd Models ◽  
Experimental Detection

Solid-phase immunoelectron microscopy for rapid diagnosis of enteroviruses

1984 ◽  
Vol 42 ◽  
pp. 226-227 ◽  
Author(s):  
K. Pegg-Feige ◽  
F. W. Doane
Keyword(s):  
Electron Microscopy ◽  
Cell Culture ◽  
Immunoelectron Microscopy ◽  
Detection Method ◽  
Solid Phase ◽  
Protein A ◽  
Plant Viruses ◽  
Rapid Diagnosis ◽  
Virus Diagnosis ◽  
Antiviral Antibody

Immunoelectron microscopy (IEM) applied to rapid virus diagnosis offers a more sensitive detection method than direct electron microscopy (DEM), and can also be used to serotype viruses. One of several IEM techniques is that introduced by Derrick in 1972, in which antiviral antibody is attached to the support film of an EM specimen grid. Originally developed for plant viruses, it has recently been applied to several animal viruses, especially rotaviruses. We have investigated the use of this solid phase IEM technique (SPIEM) in detecting and identifying enteroviruses (in the form of crude cell culture isolates), and have compared it with a modified “SPIEM-SPA” method in which grids are coated with protein A from Staphylococcus aureus prior to exposure to antiserum.

Electron microscopy studies of PZT ferroelectric film capacitor structures

1992 ◽  
Vol 50 (2) ◽  
pp. 1364-1365
Author(s):  
V. Kaushik ◽  
P. Maniar ◽  
J. Olowolafe ◽  
R. Jones ◽  
A. Campbell ◽  
...  
Keyword(s):  
Electric Fields ◽  
Sol Gel ◽  
Ferroelectric Material ◽  
Dielectric Constants ◽  
Dielectric Films ◽  
Lead Zirconium Titanate ◽  
Si Substrate ◽  
Film Capacitor ◽  
Pzt Films ◽  
High Dielectric

Lead zirconium titanate films (Pb (Zr,Ti) O3 or PZT) are being considered for potential application as dielectric films in memory technology due to their high dielectric constants. PZT is a ferroelectric material which shows spontaneous polarizability, reversible under applied electric fields. We report herein some results of TEM studies on thin film capacitor structures containing PZT films with platinum-titanium electrodes.The wafers had a stacked structure consisting of PZT/Pt/Ti/SiO2/Si substrate as shown in Figure 1. Platinum acts as electrode material and titanium is used to overcome the problem of platinum adhesion to the oxide layer. The PZT (0/20/80) films were deposited using a sol-gel method and the structure was annealed at 650°C and 800°C for 30 min in an oxygen ambient. XTEM imaging was done at 200KV with the electron beam parallel to <110> zone axis of silicon.Figure 2 shows the PZT and Pt layers only, since the structure had a tendency to peel off at the Ti-Pt interface during TEM sample preparation.

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