In-Situ Measurement Method and Rate Theory for Clarifying Multi-Component Organic Compounds Adsorption and Desorption on Silicon Surface

2019 ◽  
Vol 11 (3) ◽  
pp. 363-374
Author(s):  
Hitoshi Habuka ◽  
Daisuke Yamaya
Keyword(s):  
Organic Compounds ◽  
Silicon Surface ◽  
Measurement Method ◽  
In Situ Measurement ◽  
Rate Theory ◽  
Adsorption And Desorption

Concentration of Three Organic Compounds Influencing each other on Silicon Surface

2012 ◽  
Vol 187 ◽  
pp. 303-306
Author(s):  
Hitoshi Habuka ◽  
Tatsuhito Naito ◽  
Norihiro Kawahara
Keyword(s):  
Steady State ◽  
Organic Compound ◽  
Organic Compounds ◽  
Silicon Surface ◽  
Quartz Crystal ◽  
Surface Concentration ◽  
The Other ◽  
Rate Theory ◽  
Organic Contamination

The surface concentrations of organic compounds in a three-component (isopropanol-diethylphthalate-octanol) system were in situ measured using a quartz crystal microbalance. Additionally, the surface concentrations were calculated on the basis of the rate theory, to show that the surface concentration of organic compound was influenced by the other organic compounds. The net situation of airborne organic contamination may change, even when the total amount of organic compounds adsorbed on silicon surface seems to be in a steady state.

A magnetic field in situ measurement method of the heating film in atomic sen

2021 ◽  
pp. 1-1
Author(s):  
Xiaoyang Liang ◽  
Xinxiu Zhou ◽  
Die Hu ◽  
Wenfeng Wu ◽  
Yuchen Jia
Keyword(s):  
Magnetic Field ◽  
Measurement Method ◽  
In Situ Measurement

Fiber-optic-based chemical sensors for in-situ measurement of metals and aromatic organic compounds in seawater and soil systems

1990 ◽  
Author(s):  
Stephen H. Lieberman ◽  
Scott Inman ◽  
Gregory A. Theriault ◽  
Stafford S. Cooper ◽  
Philip G. Malone ◽  
...  
Keyword(s):  
Organic Compounds ◽  
Chemical Sensors ◽  
Fiber Optic ◽  
In Situ Measurement ◽  
Soil Systems

In situ measurement method of GaAs surface coverage using secondary electron intensity

1991 ◽  
Vol 115 (1-4) ◽  
pp. 348-352 ◽  
Author(s):  
Kiyoshi Kanisawa ◽  
Jiro Osaka ◽  
Shigeru Hirono ◽  
Naohisa Inoue
Keyword(s):  
Measurement Method ◽  
Secondary Electron ◽  
Surface Coverage ◽  
In Situ Measurement ◽  
Gaas Surface ◽  
Electron Intensity

scholarly journals APPLICATION OF AN IN-SITU MEASUREMENT METHOD USING ENSEMBLE AVERAGING TECHNIQUE TO MATERIAL DEVELOPMENT

2015 ◽  
Vol 21 (47) ◽  
pp. 167-170 ◽  
Author(s):  
Reiji TOMIKU ◽  
Noriko OKAMOTO ◽  
Toru OTSURU ◽  
Takaaki KAMIMIZU ◽  
Makoto YAMAGUCHI
Keyword(s):  
Measurement Method ◽  
In Situ Measurement ◽  
Ensemble Averaging ◽  
Averaging Technique ◽  
Material Development

Losses at corner bending in optical waveguides: an in situ measurement method

1984 ◽  
Vol 23 (20) ◽  
pp. 3506 ◽  
Author(s):  
Yasuyuki Okamura ◽  
Sadahiko Yamamoto
Keyword(s):  
Optical Waveguides ◽  
Measurement Method ◽  
In Situ Measurement
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