In situ measurement method of GaAs surface coverage using secondary electron intensity

1991 ◽  
Vol 115 (1-4) ◽  
pp. 348-352 ◽  
Author(s):  
Kiyoshi Kanisawa ◽  
Jiro Osaka ◽  
Shigeru Hirono ◽  
Naohisa Inoue
Keyword(s):  
Measurement Method ◽  
Secondary Electron ◽  
Surface Coverage ◽  
In Situ Measurement ◽  
Gaas Surface ◽  
Electron Intensity

A magnetic field in situ measurement method of the heating film in atomic sen

2021 ◽  
pp. 1-1
Author(s):  
Xiaoyang Liang ◽  
Xinxiu Zhou ◽  
Die Hu ◽  
Wenfeng Wu ◽  
Yuchen Jia
Keyword(s):  
Magnetic Field ◽  
Measurement Method ◽  
In Situ Measurement

μm-Scale Lateral Growth of Ga-Monolayers Observed In-Situ by Electron Microscopy

1989 ◽  
Vol 159 ◽  
Author(s):  
J. Osaka ◽  
N. Inoue
Keyword(s):  
Electron Microscopy ◽  
Secondary Electron ◽  
High Vacuum ◽  
Ultra High Vacuum ◽  
Intensity Difference ◽  
Lateral Growth ◽  
Mbe Growth ◽  
Electron Intensity ◽  
Scanning Electron

ABSTRACTAn ultra high vacuum scanning electron microscope equipped to an MBE system is utilized to study a transient of a surface atomic structure during MBE growth of GaAs and AlGaAs by the alternate supply method. Lateral growth of a Ga-monolayer over microns is realized utilizing Ga droplets. This is confirmed by discriminating the Ga and As top layer by using the secondary electron intensity difference between the Ga and As top layer. The growth mechanism of the Ga monolayer is discussed based on the results.

scholarly journals APPLICATION OF AN IN-SITU MEASUREMENT METHOD USING ENSEMBLE AVERAGING TECHNIQUE TO MATERIAL DEVELOPMENT

2015 ◽  
Vol 21 (47) ◽  
pp. 167-170 ◽  
Author(s):  
Reiji TOMIKU ◽  
Noriko OKAMOTO ◽  
Toru OTSURU ◽  
Takaaki KAMIMIZU ◽  
Makoto YAMAGUCHI
Keyword(s):  
Measurement Method ◽  
In Situ Measurement ◽  
Ensemble Averaging ◽  
Averaging Technique ◽  
Material Development

Losses at corner bending in optical waveguides: an in situ measurement method

1984 ◽  
Vol 23 (20) ◽  
pp. 3506 ◽  
Author(s):  
Yasuyuki Okamura ◽  
Sadahiko Yamamoto
Keyword(s):  
Optical Waveguides ◽  
Measurement Method ◽  
In Situ Measurement

An In Situ Measurement Method for Detecting Dissolved Deep-Sea Sulfur Ion Concentration

2018 ◽  
Vol 45 (9) ◽  
pp. 0911011
Author(s):  
刘宁武 Liu Ningwu ◽  
王洪亮 Wang Hongliang ◽  
何天博 He Tianbo ◽  
赵月霞 Zhao Yuexia ◽  
丁忠军 Ding Zhongjun ◽  
...  
Keyword(s):  
Deep Sea ◽  
Measurement Method ◽  
In Situ Measurement ◽  
Ion Concentration
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