F-55 a Novel High Resolution Tunable X-ray Fluorescence Imaging Spectrometer for Materials Analysis

2007 ◽  
Vol 22 (2) ◽  
pp. 188-188
Author(s):  
S. Seshadri ◽  
M. Feser ◽  
W. Yun
2007 ◽  
Author(s):  
Marco Barbera ◽  
Roberto Candia ◽  
Alfonso Collura ◽  
Gaspare Di Cicca ◽  
Salvatore Varisco ◽  
...  

2020 ◽  
Vol 500 (4) ◽  
pp. 4801-4817
Author(s):  
A Danehkar ◽  
M Karovska ◽  
J J Drake ◽  
V L Kashyap

ABSTRACT RT Cru belongs to the rare class of hard X-ray emitting symbiotics, whose origin is not yet fully understood. In this work, we have conducted a detailed spectroscopic analysis of X-ray emission from RT Cru based on observations taken by the Chandra Observatory using the Low Energy Transmission Grating (LETG) on the High-Resolution Camera Spectrometer (HRC-S) in 2015 and the High Energy Transmission Grating (HETG) on the Advanced CCD Imaging Spectrometer S-array (ACIS-S) in 2005. Our thermal plasma modelling of the time-averaged HRC-S/LETG spectrum suggests a mean temperature of kT ∼ 1.3 keV, whereas kT ∼ 9.6 keV according to the time-averaged ACIS-S/HETG. The soft thermal plasma emission component (∼1.3 keV) found in the HRC-S is heavily obscured by dense materials (>5 × 1023 cm−2). The aperiodic variability seen in its light curves could be due to changes in either absorbing material covering the hard X-ray source or intrinsic emission mechanism in the inner layers of the accretion disc. To understand the variability, we extracted the spectra in the ‘low/hard’ and ‘high/soft’ spectral states, which indicated higher plasma temperatures in the low/hard states of both the ACIS-S and HRC-S. The source also has a fluorescent iron emission line at 6.4 keV, likely emitted from reflection off an accretion disc or dense absorber, which was twice as bright in the HRC-S epoch compared to the ACIS-S. The soft thermal component identified in the HRC-S might be an indication of a jet that deserves further evaluations using high-resolution imaging observations.


2006 ◽  
Vol 12 (S02) ◽  
pp. 538-539
Author(s):  
S Seshadri ◽  
W Yun ◽  
M Feser ◽  
F Duewer ◽  
S Wang

Extended abstract of a paper presented at Microscopy and Microanalysis 2006 in Chicago, Illinois, USA, July 30 – August 3, 2006


Author(s):  
Jonathan Grindlay ◽  
Branden E. Allen ◽  
JaeSub E. Hong ◽  
Daniel E. Violette ◽  
Martin E. Elvis ◽  
...  

1987 ◽  
Vol 31 ◽  
pp. 35-52 ◽  
Author(s):  
R.W. Ryon ◽  
H.E. Martz ◽  
J.M. Hernandez ◽  
J.J. Haskins ◽  
R.A. Day ◽  
...  

There is a veritable renaissance occurring in x-ray imaging. X-ray imaging by radiography has been a highly developed technology in medicine and industry for many years. However, high resolution imaging has not generally been practical because sources have been relatively dim and diffuse, optical elements have been nonexistant for most applications, and detectors have been slow and of low resolution. Materials analysis needs have therefore gone unmet. Rapid progress is now taking place because we are able to exploit developments in microelectronics and related material fabrication techniques, and because of the availability of intense x-ray sources.


2021 ◽  
Vol 170 ◽  
pp. 109610
Author(s):  
R. Figueroa ◽  
F. Geser ◽  
J. López-Correa ◽  
F. Malano ◽  
M. Valente

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