scholarly journals X-Ray Imaging: Status and Trends

1987 ◽  
Vol 31 ◽  
pp. 35-52 ◽  
Author(s):  
R.W. Ryon ◽  
H.E. Martz ◽  
J.M. Hernandez ◽  
J.J. Haskins ◽  
R.A. Day ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
Rapid Progress ◽  
Optical Elements ◽  
Materials Analysis ◽  
X Ray ◽  
X Ray Imaging ◽  
Status And Trends ◽  
Resolution Imaging ◽  
Material Fabrication

There is a veritable renaissance occurring in x-ray imaging. X-ray imaging by radiography has been a highly developed technology in medicine and industry for many years. However, high resolution imaging has not generally been practical because sources have been relatively dim and diffuse, optical elements have been nonexistant for most applications, and detectors have been slow and of low resolution. Materials analysis needs have therefore gone unmet. Rapid progress is now taking place because we are able to exploit developments in microelectronics and related material fabrication techniques, and because of the availability of intense x-ray sources.

Laboratory X-ray microscopy for high-resolution imaging of environmental colloid structure

2012 ◽  
Vol 329 ◽  
pp. 26-31 ◽  
Author(s):  
H.M. Hertz ◽  
M. Bertilson ◽  
O. v. Hofsten ◽  
S.-C. Gleber ◽  
J. Sedlmair ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

High Resolution Imaging and X-Ray Microanalysis with STEM in the FE-SEM

2012 ◽  
Vol 18 (S2) ◽  
pp. 390-391
Author(s):  
R. Gauvin ◽  
P. Michaud ◽  
N. Brodusch ◽  
M.L. Trudeau
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

Extended abstract of a paper presented at Microscopy and Microanalysis 2012 in Phoenix, Arizona, USA, July 29 – August 2, 2012.

scholarly journals Measuring Curved Crystal Performance for a High-Resolution, Imaging X-Ray Spectrometer

2010 ◽  
Vol 2010 ◽  
pp. 1-10 ◽  
Author(s):  
Michael J. Haugh ◽  
Richard Stewart
Keyword(s):  
High Resolution ◽  
Resolving Power ◽  
Inertial Confinement ◽  
High Resolution Imaging ◽  
Doppler Broadening ◽  
X Ray Diffraction ◽  
High Quality ◽  
Reflectivity Curve ◽  
X Ray ◽  
Resolution Imaging

This paper describes the design, crystal selection, and crystal testing for a vertical Johann spectrometer operating in the 13 keV range to measure ion Doppler broadening in inertial confinement plasmas. The spectrometer is designed to use thin, curved, mica crystals to achieve a resolving power of E/ΔE>2000. A number of natural mica crystals were screened for flatness and X-ray diffraction width to find samples of sufficient perfection for use in the instrument. Procedures to select and mount high quality mica samples are discussed. A diode-type X-ray source coupled to a dual goniometer arrangement was used to measure the crystal reflectivity curve. A procedure was developed for evaluating the goniometer performance using a set of diffraction grade Si crystals. This goniometer system was invaluable for identifying the best original crystals for further use and developing the techniques to select satisfactory curved crystals for the spectrometer.

scholarly journals High-resolution imaging of warm x-ray sources with a Wolter optic on the Z Machine.

2020 ◽  
Author(s):  
Jeffrey Fein ◽  
David Ampleford ◽  
J. Vogel ◽  
B. Kozioziemski ◽  
C. Walton ◽  
...  
Keyword(s):  
High Resolution ◽  
High Resolution Imaging ◽  
X Ray ◽  
Resolution Imaging

Modeling of dissolution and resolution in contact x-ray microscopy

1994 ◽  
Vol 52 ◽  
pp. 62-63
Author(s):  
Y. Wang ◽  
C. Jacobsen
Keyword(s):  
High Resolution ◽  
Numerical Modelling ◽  
Short Pulse ◽  
Water Layer ◽  
Black Body ◽  
High Resolution Imaging ◽  
Finite Sample ◽  
X Ray ◽  
Resolution Imaging ◽  
Different Diameters

Contact x-ray microscopy or microradiography offers a simple-to-use approach to high resolution imaging of wet, thick biological specimens. One great advantage of the technique is that it can be usedwith short pulse, incoherent x-ray sources such as laser produced plasmas, and polymer replicas or direct AFM viewing are promising new approaches to image readout. However, it has long been pointed outthat issues such as diffraction blurring over finite sample-to-resist spacing, shot noise in the exposure, and sidecutting during development must be considered in evaluating contact x-ray microradiographs.We present here the results of numerical modelling of contact x-ray microscopy using photoresists. We assume a phantom consisting of protein rods and balls of different diameters, all embedded in a water layer. We assume that the x-ray exposure is provided by a black body source with temperature kBT = 100 eV (such as in a laser-produced plasma), and that the black bodyspectrum is then modified by x-ray transmission in 0.1/μm of Al2O3, 0.1μm of Si3N4, and 5μm of water.

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