scholarly journals A Novel Spectrometer for Measuring Laser-Produced Plasma X-Ray in Inertial Confinement Fusion

2012 ◽  
Vol 2012 ◽  
pp. 1-5
Author(s):  
Zhu Gang ◽  
Xiong Xian-cai ◽  
Zhong Xian-xin ◽  
Yang Yan

In the experimental investigations of inertial confinement fusion, the laser-produced high-temperature plasma contains very abundant information, such as the electron temperature and density, ionization. In order to diagnose laser-plasma distribution in space and evolution in time, an elliptical curved crystal spectrometer has been developed and applied to diagnose X-ray of laser-produced plasma in 0.2~2.46 nm region. According to the theory of Bragg diffraction, four kinds of crystal including LiF, PET, MiCa, and KAP were chosen as dispersive elements. The distance of crystal lattice varies from 0.4 to 2.6 nm. Bragg angle is in the range of 30°~67.5°, and the spectral detection angle is in 55.4°~134°. The curved crystal spectrometer mainly consists of elliptical curved crystal analyzer, vacuum configuration, aligning device, spectral detectors and three-dimensional microadjustment devices. The spectrographic experiment was carried out on the XG-2 laser facility. Emission spectrum of Al plasmas, Ti plasma, and Au plasmas have been successfully recorded by using X-ray CCD camera. It is demonstrated experimentally that the measured wavelength is accorded with the theoretical value.

2009 ◽  
Vol 105 (11) ◽  
pp. 113112 ◽  
Author(s):  
Jeffrey A. Koch ◽  
Otto L. Landen ◽  
Bernard J. Kozioziemski ◽  
Nobuhiko Izumi ◽  
Eduard L. Dewald ◽  
...  

Author(s):  
C. W. Price ◽  
E. F. Lindsey

Thickness measurements of thin films are performed by both energy-dispersive x-ray spectroscopy (EDS) and x-ray fluorescence (XRF). XRF can measure thicker films than EDS, and XRF measurements also have somewhat greater precision than EDS measurements. However, small components with curved or irregular shapes that are used for various applications in the the Inertial Confinement Fusion program at LLNL present geometrical problems that are not conducive to XRF analyses but may have only a minimal effect on EDS analyses. This work describes the development of an EDS technique to measure the thickness of electroless nickel deposits on gold substrates. Although elaborate correction techniques have been developed for thin-film measurements by x-ray analysis, the thickness of electroless nickel films can be dependent on the plating bath used. Therefore, standard calibration curves were established by correlating EDS data with thickness measurements that were obtained by contact profilometry.


2011 ◽  
Vol 18 (3) ◽  
pp. 032706 ◽  
Author(s):  
R. E. Olson ◽  
G. A. Rochau ◽  
O. L. Landen ◽  
R. J. Leeper

2013 ◽  
Vol 22 (10) ◽  
pp. 104202
Author(s):  
Zong-Qing Zhao ◽  
Wei-Hua He ◽  
Jian Wang ◽  
Yi-Dan Hao ◽  
Lei-Feng Cao ◽  
...  

2019 ◽  
Vol 26 (6) ◽  
pp. 062702 ◽  
Author(s):  
T. R. Joshi ◽  
S. C. Hsu ◽  
P. Hakel ◽  
N. M. Hoffman ◽  
H. Sio ◽  
...  

2007 ◽  
Vol 3 (1-2) ◽  
pp. 156-162 ◽  
Author(s):  
A.L. Kritcher ◽  
P. Neumayer ◽  
M.K. Urry ◽  
H. Robey ◽  
C. Niemann ◽  
...  

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