scholarly journals 2 Dimensional Dislocation Dynamics – A New Technique for the Simulation of Deformation Microtextures

1997 ◽  
Vol 28 (3-4) ◽  
pp. 167-179
Author(s):  
F. Roters ◽  
D. Raabe

A new technique for the simulation of microtexture evolution during cold deformation which is based on 2 dimensional (2D) dislocation dynamics is presented. In the simulation all involved dislocations are regarded as infinite straight line detects which are embedded in an otherwise isotropic linear elastic medium. As the model is 2D only edge dislocations are considered.In the first simulation step the net local stresses are derived and used to calculate the resulting dislocation motion. Dislocation multiplication, annihilation and reactions are taken into account. Thermal activation is included. In the second step the local misorientations arising from the dislocation distribution are calculated.This method shows in microscopic detail how misorientations are generated and distributed within grains during plastic deformation.

2021 ◽  
Vol 1 (1) ◽  
pp. 01-12
Author(s):  
Muhammad Wasim ◽  

Conventional Line-based Raster-stereography has been a popular technique for 3-D surface topography. However, in its application for human face screening, the problem of line breaking was observed. In order to resolve this problem, there came up a new technique called dotted raster-stereography. The previously reported version of dotted raster-stereography extracted the curvature features of human face. This paper presents a modified version, viz. differential dotted raster-stereography in which instead of curvature, differences in straight line distances between adjacent points are calculated. A comparative picture of the two versions of dotted raster-stereography techniques is presented. Results suggest that this new differential version of dotted raster-stereography algorithm is faster in execution due to its simpler implementation in software, though lower in accuracy, as compared with the previously reported curvature-based version of dotted raster stereography.


2005 ◽  
Vol 25 (1_suppl) ◽  
pp. S543-S543
Author(s):  
Satoshi Kimura ◽  
Keigo Matsumoto ◽  
Yoshio Imahori ◽  
Katsuyoshi Mineura ◽  
Toshiyuki Itoh

2009 ◽  
Vol 56 (S 01) ◽  
Author(s):  
J Bickenbach ◽  
R Rossaint ◽  
R Autschbach ◽  
R Dembinski

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