Growth processes of poly methylmethacrylate particles investigated by atomic force microscopy

2007 ◽  
Vol 18 (5) ◽  
pp. 567-577 ◽  
Author(s):  
Tetsuya Yamamoto ◽  
Ko Higashitani
Keyword(s):  
Atomic Force Microscopy ◽  
Growth Processes ◽  
Force Microscopy ◽  
Atomic Force

Growth Processes of GaAs Grown by Atomic Layer Epitaxy Revealed by Atomic Force Microscopy

1994 ◽  
Vol 33 (Part 2, No. 9B) ◽  
pp. L1292-L1294 ◽  
Author(s):  
Haruki Yokoyama ◽  
Masafumi Tanimoto ◽  
Masanori Shinohara ◽  
Naohisa Inoue
Keyword(s):  
Atomic Force Microscopy ◽  
Atomic Layer ◽  
Atomic Layer Epitaxy ◽  
Growth Processes ◽  
Force Microscopy ◽  
Atomic Force

Investigation of nucleation and growth processes of diamond films by atomic force microscopy

1994 ◽  
Vol 76 (7) ◽  
pp. 4099-4106 ◽  
Author(s):  
M. A. George ◽  
A. Burger ◽  
W. E. Collins ◽  
J. L. Davidson ◽  
A. V. Barnes ◽  
...  
Keyword(s):  
Atomic Force Microscopy ◽  
Diamond Films ◽  
Nucleation And Growth ◽  
Growth Processes ◽  
Force Microscopy ◽  
Atomic Force

scholarly journals Kinetic of Growth Processes of PbTe:Bi Nanocrystalline Structures on Mica-Muscovite Cleavages Substrate

2015 ◽  
Vol 16 (2) ◽  
pp. 293-296
Author(s):  
Ya.P. Saliy ◽  
O.I. Nalyvaychuk ◽  
M.V. Reykalo
Keyword(s):  
Atomic Force Microscopy ◽  
Crystal Growth ◽  
Epitaxial Films ◽  
Surface Topology ◽  
Growth Processes ◽  
Force Microscopy ◽  
Atomic Force ◽  
Nanocrystalline Structures ◽  
Wall Method

The results of investigation of formation plumbum telluride epitaxial films by atomic force microscopy are presented. The surface topology of PbTe films grown by hot wall method on micas-muscovite fresh cleavages substrates for 350 - 630 K condensation temperatures range and thickness up to 10 μm are given. This indicated the presence of the vapour - crystal growth processes of a films without a coalescence.

Electrostatic Forces on the Surface of Metals as Measured by Atomic Force Microscopy

2000 ◽  
Vol 10 (1-2) ◽  
pp. 15
Author(s):  
Eugene Sprague ◽  
Julio C. Palmaz ◽  
Cristina Simon ◽  
Aaron Watson
Keyword(s):  
Atomic Force Microscopy ◽  
Electrostatic Forces ◽  
Force Microscopy ◽  
Atomic Force
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