Investigation of InGaN Layer Grown Under In-Rich Condition by Reflectance Difference Spectroscopy Microscope

2018 ◽  
Vol 18 (11) ◽  
pp. 7468-7472 ◽  
Author(s):  
Xiantong Zheng ◽  
Wei Huang ◽  
Hongwei Liang ◽  
Ping Wang ◽  
Yu Liu ◽  
...  
Keyword(s):  
Difference Spectroscopy ◽  
Ingan Layer ◽  
Reflectance Difference Spectroscopy ◽  
Rich Condition

In situ reflectance difference spectroscopy of N-plasma doped ZnTe grown by molecular beam epitaxy

1998 ◽  
Vol 73 (26) ◽  
pp. 3857-3859 ◽  
Author(s):  
D. Stifter ◽  
M. Schmid ◽  
K. Hingerl ◽  
A. Bonanni ◽  
M. Garcia-Rocha ◽  
...  
Keyword(s):  
Molecular Beam Epitaxy ◽  
Molecular Beam ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy

Reflectance difference spectroscopy as an optical probe for the in situ determination of doping levels in GAAS

2006 ◽  
Author(s):  
A. Lastras-Martinez ◽  
I. Lara-Velazquez ◽  
R.e. Balderas-Navarro ◽  
J. Ortega-Gallegos ◽  
L.f. Lastras-Martinez
Keyword(s):  
Optical Probe ◽  
Difference Spectroscopy ◽  
Reflectance Difference Spectroscopy
Sign in / Sign up

Export Citation Format

Share Document